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Electrical Conductance of Bolted Copper Joints for Cryogenic Applications

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Abstract

We present the results of electric contact resistance measurements at low temperatures on copper-to-copper bolted joints. Our accurate and systematic data display a rather small dispersion, and may be a useful tool for cryogenic applications like pulse-tubes, dilution refrigerators and nuclear refrigerators.

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Acknowledgments

This work was supported by the European Community Research Infrastructures under the FP7 Capacities Specific Programme, MICROKELVIN project number 228464, and by the Grant High-Q Fermions (ANR-2010-INTB-403-01).

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Authors and Affiliations

  1. Université Grenoble Alpes, Institut NÉEL, 38042 , Grenoble, France

    F. Blondelle, A. Sultan, E. Collin & H. Godfrin

  2. CNRS, Institut NÉEL, 38042 , Grenoble, France

    F. Blondelle, A. Sultan, E. Collin & H. Godfrin

Authors
  1. F. Blondelle
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  2. A. Sultan
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  3. E. Collin
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  4. H. Godfrin
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Correspondence to H. Godfrin.

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Blondelle, F., Sultan, A., Collin, E. et al. Electrical Conductance of Bolted Copper Joints for Cryogenic Applications. J Low Temp Phys 175, 877–887 (2014). https://doi.org/10.1007/s10909-014-1142-4

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  • DOI: https://doi.org/10.1007/s10909-014-1142-4

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