Abstract
Using compositionally step graded metamorphic AlGaInAs buffers with a thickness of 2.4 μm, we grow InP epilayers on GaAs substrates with miscuts of 2°, 7°, and 15° toward (111)A by metalorganic chemical vapor deposition. The InP top layer is almost strain-free and its quality depends on the substrate miscut. Strong phase separation in AlGaInAs buffers is observed in the 2° sample, while it is suppressed in 15° sample. Finally, a higher crystalline quality InP epilayer with a root-mean-square roughness of 10.1 nm is obtained on 15° substrate as confirmed by a much stronger photoluminescence peak intensity of the InP epilayer on 15° substrate compared with those on 2° and 7° substrates. Growth of high quality InP on GaAs opens up the possibility of integrating GaAs and InP based devices, and will greatly enhance the functionality of devices grown on GaAs substrates.
Similar content being viewed by others
References
N. Hayafuji, T. Kimura, N. Yoshida, N. Kaneno, M. Tsugami, K. Mizuguchi, T. Murotani, S. Ibuki, Jpn. J. Appl. Phys. 28, L1721 (1989)
C.I. Liao, K.F. Yarn, C.L. Lin, Y.L. Lin, Y.H. Wang, Jpn. J. Appl. Phys. 42, 4913 (2003)
P.A. Postigo, F. Suárez, A. Sanz-Hervás, J. Sangrador, C.G. Fonstad, J. Appl. Phys. 103, 013508 (2008)
Y.R. Sun, K.L. Li, J.R. Dong, X.L. Zeng, Y.M. Zhao, S.Z. Yu, C.Y. Zhao, H. Yang, J. Cryst. Growth 381, 70 (2013)
H. Choi, Y. Jeong, J. Cho, M.H. Jeon, J. Cryst. Growth 311, 1091 (2009)
N.J. Quitoriano, E.A. Fitzgerald, J. Appl. Phys. 102, 033511 (2007)
L. Yang, M.T. Bulsara, K.E. Lee, E.A. Fitzgerald, J. Cryst. Growth 324, 103 (2011)
H.Q. Nguyen, E.Y. Chang, H.W. Yu, K.L. Lin, C.C. Chung, Appl. Phys. Express 4, 075501 (2011)
R.S. Goldman, H.H. Wieder, K.L. Kavanagh, Appl. Phys. Lett. 67, 344 (1995)
I. Yonenaga, K. Sumino, J. Cryst. Growth 126, 19 (1993)
M.J. Matragrano, D.G. Ast, J.R. Shealy, V. Krishnamoorthy, J. Appl. Phys. 79, 8371 (1996)
R.S. Goldman, K.L. Kavanagh, H.H. Wieder, S.N. Ehrlich, R.M. Feenstra, J. Appl. Phys. 83, 5137 (1998)
H. Chen, Y.K. Li, C.S. Peng, H.F. Liu, Y.L. Liu, Q. Huang, J.M. Zhou, Q.-K. Xue, Phys. Rev. B 65, 233303 (2002)
N.J. Quitoriano, E.A. Fitzgerald, J. Appl. Phys. 101, 073509 (2007)
S.B. Samavedam, E.A. Fitzgerald, J. Appl. Phys. 81, 3108 (1997)
S.N.G. Chu, S. Nakahara, K.E. Strege, J.W.D. Johnston, J. Appl. Phys. 57, 4610 (1985)
K.E. Lee, E.A. Fitzgerald, J. Cryst. Growth 312, 250 (2010)
Z. Zhang, S. Yang, F. Zhang, D. Li, Y. Chen, Z. Wang, J. Cryst. Growth 243, 71 (2002)
Acknowledgments
This work is financially supported by the National Natural Science Foundation of China under Contract No. 61376065 and the Suzhou Science and Technology Project under Contract No. ZXG2013044.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Sun, Y., Dong, J., Yu, S. et al. High quality InP epilayers grown on GaAs substrates using metamorphic AlGaInAs buffers by metalorganic chemical vapor deposition. J Mater Sci: Mater Electron 28, 745–749 (2017). https://doi.org/10.1007/s10854-016-5585-z
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-016-5585-z