Abstract
In this paper, we describe the development of a novel through-hole filling technique using solderable polymer composites (SPCs) with low-melting-point-alloy (LMPA) fillers. Three types of SPCs with different LMPA concentrations (40, 50 and 60 vol%) were formulated, and through-hole filling tests were conducted under different environmental reflow conditions (atmospheric pressure and decompression conditions). The results indicated that the through-hole filling assemblies showed weak filling characteristics with huge defects under atmospheric pressure reflow conditions because polymer trapped in the hole. On the other hand, the through-hole filling assemblies fabricated under decompression reflow conditions showed favorable filling characteristics and excellent, stable electrical properties due to the effective removal of polymer from the through-hole.
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M.F. Lai, S.W. Li, J.Y. Shin, K.N. Chen, Microelectron. Eng. 88, 3282–3286 (2011)
Y.C. Chan, P.L. Tu, K.C. Hung, Microelectron. Reliab. 41, 1867–1875 (2001)
Y.K. Ho, Y.W. Chang, Proceedings of 50th Design Automation Conference on ACM/EDAC/IEEE, (2013), pp. 1-6
J.Y. Shih, Y.C. Chen, C.H. Chiu, C.L. Lo, C.C. Chang, K.N. Chen, Nanoscale Res. Lett. 9, 541 (2014)
N.E. Jerger, A. Kannan, Z. Li, G.H. Loh, Proceedings of the 47th International Symposium on Microarchitecture, (2014), pp. 458–470
S. Spiesshoefer, L. Schaper, Proceedings of 53rd International Conference on Electronic Components and Technology, (2003), pp. 631–633
R. Beica, C. Sharbono, T. Ritzdorf, Proceedings of the 58th International Confernece on Electronic Components and Technology, (2008), pp. 577–583
M. Motoyoshi, Proc. IEEE 97, 43–48 (2009)
L. Hofmann, R. Ecke, S.E. Schulz, T. Gessner, Microelectron. Eng. 88, 705–708 (2011)
J. Glazer, J. Electron. Mater. 23, 693–700 (1994)
S.K. Kang, A.K. Sarkhel, J. Electron. Mater. 23, 701–707 (1994)
L.C. Prasad, A. Mikula, J. Alloys Compd. 282, 279–285 (1999)
N.P. Cheremisinoff, Handbook of Industrial Toxicology and Hazardous Materials (CRC Press, New York, 1999), p. 444
A. Lewis, Proceedings of the 5th Internationsal. Conference on Lead Free Electronics and Assemblies, (2004), pp. 1–10
J.B. Jullien, H. Fremont, J.Y. Deletage, Microelectron. Reliab. 53, 1597–1601 (2013)
A.S. Cebrian, R. Basler, F. Klunker, M. Zogg, Int. J. Adhes. Adhes. 48, 51–58 (2014)
A.A. Gallo, R. Munamarty, IEEE Trans. Reliab. 44, 362–367 (1995)
J.E. Galloway, B.M. Miles, Compon. IEEE Trans. Packag. Manuf. Technol. A 20, 274–279 (1997)
R. Arntzen, Ph.D. Dissertation, Department of Chemical Engineering Norwegian University of Science and Technology Trondheim, Norway (2011) p. 6
K. Banerji, F.D. Alves, R. F. Darveaux, US Patent 5203076 (1993) p. 4–5
X.R. Guo, W.B. Young, Microelectron. Reliab. 55, 613–622 (2015)
M.K. Schwiebert, W.H. Leong, I.E.E.E. Trans, Compon. Packag. Manuf. Technol. C 19, 133–137 (1996)
J.D. Kish, C. Leng, J. Kelley, J. Hiltner, Y. Zhang, Y. Liu, Atmos. Environ. 79, 561–565 (2013)
M. Takahashi, T. Kawamura, Y. Yamamoto, H. Ohnari, S. Himuro, H. Shakutsui, J. Phys. Chem. B 107, 2171–2173 (2003)
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This research was supported by the Chung-Ang University Research Scholarship Grants in 2014 and Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and future Planning (2014007164).
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Lee, J.I., Yim, BS., Yun, M.S. et al. Through-hole filling characteristics of solderable polymer composites with low melting point alloy fillers. J Mater Sci: Mater Electron 27, 982–991 (2016). https://doi.org/10.1007/s10854-015-3842-1
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DOI: https://doi.org/10.1007/s10854-015-3842-1