Abstract
Growth, structural and electrical properties of perovskite type LaNiO3 thin film nanostructures using chemical solution deposition at annealing temperatures ranging from 550 to 800 °C has been optimized. Poly-vinyl alcohol was used as stabilizing agent in the precursor solutions. X-ray diffraction and AFM, respectively confirmed phase purity and nanostructured growth with mono dispersed crystallite distribution at processing temperature of 700 °C. Crystalline strain as low as 1 % was estimated from the XRD peaks; confirming relaxed and stable LNO crystalline structure deposited on quartz substrate. A systematic variation in the resistivity and carrier concentration with annealing temperatures were observed, revealing that 700 °C is an optimum temperature for a phase pure LNO films with smooth surface structures.
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Acknowledgments
Authors thank Dr. A. K. Debnath for fruitful discussions. NCP thank DAE-BRNS for research fellowship under the project sanction No. 2011/37P/13/BRNS.
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Pandya, N.C., Joshi, U.S. Optimization of structural, surface and electrical properties of solution processed LaNiO3 conducting oxide. J Mater Sci: Mater Electron 26, 2445–2450 (2015). https://doi.org/10.1007/s10854-015-2704-1
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DOI: https://doi.org/10.1007/s10854-015-2704-1