Abstract
The bottom-up self-assembly Cu2O/ZnO heterojunction thin films electrodeposited on indium tin oxide flexible substrate (polyethylene terephthalate, PET) have been investigated by impedance spectroscopy. It is used to study the electric conductivity of the Cu2O/ZnO heterojunction thin films combined electric modulus and impedance plots. The electric modulus and impedance as a function of the frequency analysis show the distribution of the relaxation times due to the hopping of charge carriers among defects in the Cu2O/ZnO heterojunction thin films. The values of activation energies derived from the electric modulus and impedance are found to be 0.42 and 0.40 eV, respectively, which is close to the activation energy (0.28 eV) of dc electrical conductivity and activation energy of ac conductivity (0.45–0.14 eV at the range of 100 Hz–1 MHz) in the temperature range over 303–423 K.
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Tanaka H, Shimakawa T, Miyata T, Sato H, Minami T (2004) Thin Solid Films 469–470:80
Yi GC, Wang C, Park W (2005) Semicond Sci Technol 20:522
Brandt M, Wenchstern H, Stölzel M, Hochmuch H, Lorenz M, Grundmann M (2011) Semicond Sci Technol 26:014040
Guo HH, Lin ZH, Feng ZF, Lin LL, Zhou JZ (2009) J Phys Chem C 113:12546
Gao SY, Zheng HJ, Deng RP, Wang XM, Sun DH, Zheng GL (2006) Appl Phys Lett 89:123125
Jeong SH, Song SH, Nagaich K, Campbell SA, Aysil ES (2011) Thin Solid Films 519:6613
Jeong SS, Mittiga A, Salza E, Masci A, Passerini S (2008) Electrochim Acta 53:2226
Cui JB, Gibson UJ (2010) J Phys Chem C 114:6408
Liu TY, Liao HC, Lin CC, Hu SH, Chen SY (2006) Langmuir 22:5804
Macdonald JR (1987) Impedance spectroscopy-emphasizing solid materials and systems. Wiley-Interscience, New York
Li M, Fetiera A, Sinclair DC (2005) J Appl Phys 98:084101
Zhai YC, Fan HQ, Li Q, Yan W (2012) Appl Surf Sci 258:3232
Sinclair DC, West AR (1989) J Appl Phys 66:3850
Prabakar K, Narayandass SK, Mangalaraj D (2003) Mater Chem Phys 78:809
Singh BK, Kumar B (2010) Cryst Res Technol 45:1003
Prabakar K, Narayandass SK, Mangalaraj D (2003) Mater Sci Eng B 98:225
Iguchi E, Udea K, Jung WH (1996) Phys Rev B 54:17431
Gerhardt R (1994) J Phys Chem Solids 55:1491
Tripathi R, Kumar A, Bharti C, Sinha TP (2010) Curr Appl Phys 10:676
Samuel MS, Koshy J, Chandran A, George KC (2011) Curr Appl Phys 11:1094
Jonscher AK (1999) J Phys D Appl Phys 32:R57
Jonscher AK (1996) Universal relaxation law. Chelsea Dielectric Press, London
Chen RH, Yen CC, Shern CS, Fukami T (2006) Solid State Ionics 177:2857
Gupta MK, Sinha N, Singh BK, Singh N, Kumar K, Kumar B (2009) Mater Lett 63:1910
Kobor D, Guiffard B, Lebrun L, Hajjaji A, Guyomar D (2007) J Phys D 40:2920
James AR, Priya S, Uchino K, Srinivas K, Kiran VV (2002) Jpn J Appl Phys 41:5272
Acknowledgements
This work was supported by National Nature Science Foundation (51172187), the SPDRF (20116102130002), the Doctoral fund of Ministry of Education of China(20116102120016), 111 Program (B08040) of MOE, Xi’an Science and Technology Foundation (CX1261-2, CX1261-3, XA-AM-201003), China Postdoctoral Science Foundation(20100481360), Natural Science Foundation of Shaanxi Province (2011JM6016), Shaanxi Province Foundation for Returned Scholars, High-level start-up Funding of NWPU, Fundamental Research Foundation (NPU-FFR-JC201232) of China.
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Li, Q., Xu, M., Fan, H. et al. Electrical charge conductivity behavior of electrodeposited Cu2O/ZnO heterojunction thin films on PET flexible substrates by impedance spectroscopy analysis. J Mater Sci 48, 3334–3340 (2013). https://doi.org/10.1007/s10853-012-7008-8
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DOI: https://doi.org/10.1007/s10853-012-7008-8