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Nanostructural characterization of YBCO films on metal tape with textured buffer layer fabricated by pulsed-laser deposition

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Thick YBa2Cu3O7-x (YBCO) films with high critical current density (Jc) values were deposited by pulsed-laser deposition (PLD) on Hastelloy with a textured CeO2/Gd2Zr2O7 buffer layer. Both cross-sectional and plan-view TEM specimens of the YBCO films were prepared, and then the nanostructural characterization of the films was performed by transmission electron microscopy (TEM). The YBCO films less than 1 μm thick were predominantly composed of c-axis-oriented grains, however, many a-axis-oriented grains, which grew larger with the increase of the thickness of the YBCO film, were formed beyond about 1 μm from the CeO2 interface. We found Y2O3 and copper oxides between a- and c-axes-oriented grains. In particular, Y2O3 grains were formed between the {001} plane of an a-axis-oriented grain and the {100} or {010} plane of a c-axis-oriented grain. The orientation relationships between Y2O3 and YBCO are found to be; (001)YBCO//(001)Y2O3 and (100)YBCO//(110)Y2O3. In addition, we also found gaps between YBCO grains. Since a-axis-oriented grain growth and the formation of Y2O3, copper oxides and the gaps are considered to reduce the J c values of the YBCO film, it is important to determine the optimum process conditions to suppress the nucleation of a-axis-oriented grains, impurity oxides and gaps.

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Authors and Affiliations

  1. Materials R&D Lab, Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, 456-8587, Japan

    T. Kato, H. Sasaki, Y. Sasaki, T. Hirayama & Y. Ikuhara

  2. SRL-Nagoya Coated Conductor Center, ISTEC, 2-4-1 Mutsuno, Atsuta-ku, Nagoya, 456-8587, Japan

    T. Watanabe, A. Ibi, H. Iwai, T. Muroga, S. Miyata, Y. Yamada & Y. Shiohara

  3. Material Technology Lab, Fujikura Ltd., 1-5-1 Kiba, Koto-ku, Tokyo, 135-8512, Japan

    Y. Iijima, K. Kakimoto, Y. Sutoh & T. Saitoh

  4. SRL-Division of Superconducting Tapes and Wires, ISTEC, 1-10-13 Shinonome, Koto-ku, Tokyo, 135-0062, Japan

    T. Izumi & Y. Shiohara

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  1. T. Kato
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  2. H. Sasaki
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  3. Y. Sasaki
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  4. T. Hirayama
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  5. Y. Ikuhara
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  6. T. Watanabe
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  7. A. Ibi
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  8. H. Iwai
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  9. T. Muroga
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  10. S. Miyata
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  11. Y. Yamada
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  12. Y. Iijima
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  13. K. Kakimoto
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  14. Y. Sutoh
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  15. T. Saitoh
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  16. T. Izumi
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  17. Y. Shiohara
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Correspondence to T. Kato.

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Kato, T., Sasaki, H., Sasaki, Y. et al. Nanostructural characterization of YBCO films on metal tape with textured buffer layer fabricated by pulsed-laser deposition. J Mater Sci 41, 2587–2595 (2006). https://doi.org/10.1007/s10853-006-7785-z

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  • DOI: https://doi.org/10.1007/s10853-006-7785-z

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