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Effects of film thickness on the electrical properties of YBa2Cu3O7−δ films grown on a multilayer-coated Hastelloy C276 tape by laser CVD

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Abstract

YBa2Cu3O7−δ (YBCO) films with thicknesses from 0.10 to 0.73 μm were prepared on a multilayer-coated Hastelloy C276 tape by laser chemical vapor deposition (laser CVD) using a single liquid precursor. c-axis-oriented YBCO films with an in-plane orientation were obtained. With increasing film thickness from 0.10 to 0.73 μm, the a-axis orientation slightly increased, the in-plane and out-of-plane orientations improved, and the composition approached the stoichiometric ratio. The critical temperature and critical current density for the 0.73-μm-thick YBCO film were 90 K and 1.5 MA cm−2, respectively.

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Acknowledgments

This work was supported in part by the International Superconductivity Technology Center (ISTEC). This research was also supported in part by the Japan Society for the Promotion of Science, Grant-in-Aid for Young Scientists (A) (25709069) and Challenging Exploratory Research (25630273), and the 111 project, China (B13035).

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Correspondence to Akihiko Ito.

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Zhao, P., Ito, A. & Goto, T. Effects of film thickness on the electrical properties of YBa2Cu3O7−δ films grown on a multilayer-coated Hastelloy C276 tape by laser CVD. J Electroceram 34, 137–141 (2015). https://doi.org/10.1007/s10832-014-9962-9

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  • DOI: https://doi.org/10.1007/s10832-014-9962-9

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