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A sequential order statistics approach to step-stress testing

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Abstract

For general step-stress experiments with arbitrary baseline distributions, wherein the stress levels change immediately after having observed pre-specified numbers of observations under each stress level, a sequential order statistics model is proposed and associated inferential issues are discussed. Maximum likelihood estimators (MLEs) of the mean lifetimes at different stress levels are derived, and some useful properties of the MLEs are established. Joint MLEs are also derived when an additional location parameter is introduced into the model, and estimation under order restriction of the parameters at different stress levels is finally discussed.

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References

  • Bagdonavicius V. (1978) Testing the hypothesis of additive accumulation of damages. Probability Theory and Its Applications 23: 403–408

    Google Scholar 

  • Bagdonavicius V., Nikulin M. (2002) Accelerated life models: Modeling and statistical analysis. Chapman & Hall, Boca Raton

    MATH  Google Scholar 

  • Balakrishnan N. (2009) A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests. Metrika 69: 351–396

    Article  MathSciNet  Google Scholar 

  • Balakrishnan N., Kundu D., Ng H.K.T., Kannan N. (2007) Point and interval estimation for a simple step-stress model with Type-II censoring. Journal of Quality Technology 39: 35–47

    Google Scholar 

  • Balakrishnan N., Beutner E., Kamps U. (2008) Order restricted inference for sequential k-out-of-n systems. Journal of Multivariate Analysis 99: 1489–1502

    Article  MathSciNet  MATH  Google Scholar 

  • Balakrishnan N., Beutner E., Kateri M. (2009a) Order restricted inference for exponential step-stress models. IEEE Transactions on Reliability 58: 132–142

    Article  Google Scholar 

  • Balakrishnan N., Xie Q., Kundu D. (2009b) Exact inference for a simple step-stress model from the exponential distribution under time constraint. Annals of the Institute of Statistical Mathematics 61: 251–274

    Article  MathSciNet  MATH  Google Scholar 

  • Barlow R.E., Bartholomew D.J., Bremner J.M., Brunk H.D. (1972) Statistical inference under order restrictions. Wiley, New York

    MATH  Google Scholar 

  • Chiou W.J., Cohen A. (1984) Estimating the common location parameter of exponential distributions with censored samples. Naval Research Logistics Quarterly 31: 475–482

    Article  MathSciNet  MATH  Google Scholar 

  • Cramer E., Kamps U. (1996) Sequential order statistics and k-out-of-n-systems with sequentially adjusted failure rates. Annals of the Institute of Statistical Mathematics 48: 535–549

    Article  MathSciNet  MATH  Google Scholar 

  • Cramer E., Kamps U. (2001a) Estimation with sequential order statistics from exponential distributions. Annals of the Institute of Statistical Mathematics 53: 307–324

    Article  MathSciNet  MATH  Google Scholar 

  • Cramer, E., Kamps, U. (2001b). Sequential k-out-of-n systems. In N. Balakrishnan, C. R. Rao (Eds.), Handbook of statistics. Advances in reliability (Vol. 20, pp. 301–372). Amsterdam: Elsevier.

  • Cramer E., Kamps U. (2003) Marginal distributions of sequential and generalized order statistics. Metrika 58: 293–310

    Article  MathSciNet  MATH  Google Scholar 

  • Kamps U. (1995a) A concept of generalized order statistics. Teubner, Stuttgart

    MATH  Google Scholar 

  • Kamps U. (1995b) A concept of generalized order statistics. Journal of Statistical Planning and Inference 48: 1–23

    Article  MathSciNet  MATH  Google Scholar 

  • Kateri M., Balakrishnan N. (2008) Inference for a simple step-stress model with Type-II censoring, and Weibull distributed lifetimes. IEEE Transactions on Reliability 57: 616–626

    Article  Google Scholar 

  • Kateri M., Kamps U., Balakrishnan N. (2009) A meta-analysis approach for step-stress experiments. Journal of Statistical Planning and Inference 139: 2907–2919

    Article  MathSciNet  MATH  Google Scholar 

  • Kateri, M., Kamps, U., Balakrishnan N. (2010). Optimal allocation of change points in simple step-stress experiments under Type-II censoring. Computational Statistics and Data Analysis, to appear.

  • Kotz S., Balakrishnan N., Johnson N.L. (2000) Continuous multivariate distributions, Volume 1: Models and applications. Wiley, New York

    Book  Google Scholar 

  • Meeker W.Q., Escobar L.A. (1998) Statistical methods for reliability data. Wiley, New York

    MATH  Google Scholar 

  • Miller R.W., Nelson W.B. (1983) Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability 32: 59–65

    Article  MATH  Google Scholar 

  • Nelson W.B. (1980) Accelerated life testing—step-stress models and data analyses. IEEE Transactions on Reliability 29: 103–108

    Article  MATH  Google Scholar 

  • Nelson W.B. (1990) Accelerated testing: Statistical models, test plans and data analyses. Wiley, New York

    Google Scholar 

  • Sedyakin N.M. (1966) On one physical principle in reliability theory (in Russian). Technical Cybernetics 3: 80–87

    Google Scholar 

  • Teng S.L., Yeo K.P. (2002) A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests. IEEE Transactions on Reliability 51: 177–182

    Article  Google Scholar 

  • Wang B. (2006) Unbiased estimations for the exponential distribution based on step-stress accelerated life-testing data. Applied Mathematics and Computation 173: 1227–1237

    Article  MathSciNet  MATH  Google Scholar 

  • Xiong C. (1998) Inferences on a simple step-stress model with Type-II censored exponential data. IEEE Transactions on Reliability 47: 142–146

    Article  Google Scholar 

  • Xiong C., Milliken G.A. (1999) Step-stress life-testing with random stress-change times for exponential data. IEEE Transactions on Reliability 48: 141–148

    Article  Google Scholar 

  • Xiong C., Zhu K., Ji M. (2006) Analysis of a simple step-stress life test with a random stress-change time. IEEE Transactions on Reliability 55: 67–74

    Article  Google Scholar 

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Correspondence to U. Kamps.

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Balakrishnan, N., Kamps, U. & Kateri, M. A sequential order statistics approach to step-stress testing. Ann Inst Stat Math 64, 303–318 (2012). https://doi.org/10.1007/s10463-010-0309-2

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  • DOI: https://doi.org/10.1007/s10463-010-0309-2

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