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A vibrating micro-scale CMM probe for measuring high aspect ratio structures

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Abstract

This paper describes the development and initial testing of a novel three-axis vibrating micro-scale co-ordinate measuring machine (micro-CMM) probe. The vibrating micro-CMM probe is designed to address the needs of micro-manufacturing industry, in particular the requirement to measure high aspect ratio micrometre sized features to nanometre accuracy. The vibrating micro-CMM probe was also designed to address the problems inherent with micrometre and nanometre scale co-ordinate measurements caused by surface interaction forces. The initial concepts were first developed using extensive computational modelling and materials analysis. Production techniques were also investigated. The result was a micro-CMM probe consisting of three flexures, instrumented with piezoelectric actuators and sensors. The micro-CMM probe is capable of controlled vibrations in three axes; an essential feature of the design that directly addresses the problems inherent with tactile CMM probe interactions with measurement surfaces on the micrometre and nanometre scale. The ability of this micro-CMM probe to accurately measure high aspect ratio features will be dependant on the aspect ratio of the stylus. Investigations have been conducted to determine the optimum dimensions of the stylus.

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References

  • Bauza MB, Hocken RJ, Smith ST, Woody SC (2005) Development of a virtual probe tip with an application to high aspect ratio microscale features. Rev Sci Instrum 76:095112

    Article  Google Scholar 

  • Haitjema H, Pril WO, Schellekens PHJ (2001) Development of a silicon-based nanoprobe system for 3-D measurements. Ann. CIRP 50/1/2001, pp 365–368

  • Leach RK (2009) Fundamental principles of engineering nanometrology. Elsevier, Amsterdam. ISBN: 978-0-08-096454-6

  • Lewis AJ (2003) A fully traceable miniature CMM with sub-micrometre uncertainty. In: Proc. SPIE 5190, pp 265–276

  • Meli F, Kung A (2007) AFM investigation on surface damage caused by mechanical probing with small ruby spheres. Meas Sci Technol 18:496–502

    Article  Google Scholar 

  • Meli F, Fracheboud M, Bottinelli S, Bieri M, Thalmann R, Breguet J-M, Clavel R (2003) High precision, low force 3D touch probe for measurements on small objects. In: Proceedings of euspen int. topical conference, Aachen, Germany

  • Schwenke H, Waldele F, Weiskirch C, Kunzmann H (2001) Opto-tactile sensor for 2D and 3D measurement of small structures on coordinate measuring machines. Ann CIRP 50(1):361–364

    Article  Google Scholar 

  • Smale D, Ratchev S, Segal J, Leach RK, Claverley JD (2009) Assembly of the stem and tip of an innovative micro-CMM probe. In: Proc. Lamdamap 2009, Brunel University, UK, 30th June–2nd July 2009, pp 442–451

  • Stoyanov S, Bailey C, Leach RK, Hughes B, Wilson A, O’Neill W, Dorey RA, Shaw C, Underhill D, Almond HJ (2008) Modeling and prototyping the conceptual design of 3D CMM micro-probe. In: Proc. 2nd ESITC, Greenwich, 1st–4th Sept 2008, pp 193–198

  • Sun Y, Fowkes CR, Gindy N, Leach RK (2009) Variation risk analysis: MEMS fabrication tolerance for a micro CMM probe. Int J Adv Manuf Technol. doi:10.1007/s00170-009-2251-0

  • Swallow KW (2008) 3-D microprobe metrology. Report prepared under prime contract for the US Department of Energy by Honeywell Federal Manufacturing & Technologies

  • Takaya Y, Takahashi S, Miyoshi T, Saito K (1999) Development of the nano-CMM probe based on laser trapping technology. Ann CIRP 48(1):421–424

    Article  Google Scholar 

  • Van Brussel H, Peirs J, Reynaerts D, Delchambre A, Reinhart G, Roth N, Weck M, Zussman E (2000) Assembly of Microsystems. Ann CIRP 49(2):451–472

    Article  Google Scholar 

  • van Vliet WP, Schellekens PH (1996) Accuracy limitations of fast mechanical probing. Ann ClRP 45(1):483–487

    Article  Google Scholar 

  • Wilson A, Leach RK (2009) Development of an NPL micro-probe: the micro-stylus component. NPL report ENG 15. ISSN 1754-2987

Download references

Acknowledgments

The authors would like to acknowledge the National Measurement System Engineering Measurements Programme (2008–2011) and the EPSRC 3D-Mintegration Grand Challenge Project, which provided the funding for this research.

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Correspondence to James D. Claverley.

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Claverley, J.D., Leach, R.K. A vibrating micro-scale CMM probe for measuring high aspect ratio structures. Microsyst Technol 16, 1507–1512 (2010). https://doi.org/10.1007/s00542-009-0967-2

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  • DOI: https://doi.org/10.1007/s00542-009-0967-2

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