Abstract
Recent studies have shown that the T 2 control chart with variable sampling intervals (VSI) and/or variable sample sizes (VSS) detects process shifts faster than the traditional T 2 chart. This article extends these studies for processes that are monitored with VSI and VSS using double warning lines (T 2 —DWL). It is assumed that the length of time the process remains in control has exponential distribution. The properties of T 2 —DWL chart are obtained using Markov chains. The results show that the T 2 —DWL chart is quicker than VSI and/or VSS charts in detecting almost all shifts in the process mean.
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Faraz, A., Parsian, A. Hotelling’s T2 control chart with double warning lines. Statistical Papers 47, 569–593 (2006). https://doi.org/10.1007/s00362-006-0307-x
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DOI: https://doi.org/10.1007/s00362-006-0307-x