Abstract
An extreme ultraviolet (EUV) light source (λ = 9–25 nm, 10 Hz) was developed to study EUV ablation physics and applications. The EUV source device including an elliptical total reflection mirror was optimized to provide EUV irradiance as high as 4.2 × 109 W/cm2 on ablation samples. Time-resolved spectroscopic observation of ablation plasma from a Si plate was conducted to derive electron temperature and density, and compared with those for laser-produced ablation at the same irradiance. Difference in ablation mechanism between two sources is discussed.
Similar content being viewed by others
References
T. Makimura, S. Torii, H. Niino, K. Murakami, J. Nanophotonics 4, 0040305 (2010)
A. Bartnik, H. Fiedorowicz, R. Jarocki, J. Kostecki, A. Szczurek, M. Szczurek, P. Wachulak, L. Pina, AIP Conf. Proc. 1437, 126 (2012)
M. Fajardo, P. Zeitoun, J.-C. Gaunthier, Eur. Phys. J. D 29, 69–76 (2004)
M. Berrill, F. Brizuela, B. Langdon, H. Bravo, C.S. Menoni, J.J. Rocca, J. Opt. Soc. Am. B 25, 7 (2008)
H.A. Baldis, K. Mima, A. Nishiguchi, Laser Plasma Theory and Simulation (CRC Press, Boca Raton, 1994)
K. Fukugaki, S. Amano, T. Inoue, S. Miyamoto, T. Mochizuki, Rev. Sci. Instrum. 77, 063114 (2006)
B.L. Henke, E.M. Gullikson, J.C. Davis, Date Nucl. Date Tables 54(2), 181–342 (1993)
F. Claeyssens, A. Cheesman, S.J. Hnley, M.N. Ashfold, J. Appl. Phys. 92, 6886 (2002)
NIST Atomic Spectra Datebase Lines Date http://physics.nist.gov
Acknowledgments
This work was supported by JSPS Grant-in-Aid for Young Scientists (B) number 25800303, Grant-in-Aid for Scientific Research (B) number 22340172, and MEXT Project for Creation of Research Platforms and Sharing of Advanced Research Infrastructure” opening up a new photonics industry through high-intensity lasers”.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Masuda, M., Tanaka, N., Hane, K. et al. Spectroscopic observation of ablation plasma generated with a laser-driven extreme ultraviolet light source. Appl. Phys. B 119, 421–425 (2015). https://doi.org/10.1007/s00340-015-6041-0
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00340-015-6041-0