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A note on generalized aberration in factorial designs

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Abstract.

In this paper we extend the wordlength pattern and minimum aberration for non-regular factorials. The new concepts, the generalized wordlength pattern and minimum generalized aberration, are proposed. Some connections between the generalized wordlength pattern and uniformity are given. Some applications of the new concepts in the Blackett and Burman's designs are discussed.

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Authors and Affiliations

  1. Department of Statistics, Nankai University, Tianjin, China (e-mail: cxma@nankai.edu.cn), , , , , , CN

    Chang-Xing Ma

  2. Hong Kong Baptist University and Chinese Academy of Sciences, Beijing, China (e-mail: ktfang@math.hkbu.edu.hk), , , , , , HK

    Kai-Tai Fang

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  1. Chang-Xing Ma
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  2. Kai-Tai Fang
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Received: September 2000

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Ma, CX., Fang, KT. A note on generalized aberration in factorial designs. Metrika 53, 85–93 (2001). https://doi.org/10.1007/s001840100112

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  • DOI: https://doi.org/10.1007/s001840100112

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