Goodness-of-fit tests for discrete models based on the integrated distribution function

Abstract.

This paper presents a new widely applicable omnibus test for discrete distributions which is based on the difference between the integrated distribution function Ψ(t)=∫_t ^∞ (1−F(x))dx and its empirical counterpart. A bootstrap version of the test for common lattice models has accurate error rates even for small samples and exhibits high power with respect to competitive procedures over a large range of alternatives.