Abstract
The role of uniformity measured by the centered L 2-discrepancy (Hickernell 1998a) has been studied in fractional factorial designs. The issue of a lower bound for the centered L 2-discrepancy is crucial in the construction of uniform designs. Fang and Mukerjee (2000) and Fang et al. (2002, 2003b) derived lower bounds for fractions of two- and three-level factorials. In this paper we report some new lower bounds for the centered L 2-discrepancy for a set of asymmetric fraction factorials. Using these lower bounds helps to measure uniformity of a given design. In addition, as an application of these lower bounds, we propose a method to construct uniform designs or nearly uniform designs with asymmetric factorials.
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Chatterjee, K., Fang, KT. & Qin, H. A Lower Bound for the Centered L 2-Discrepancy on Asymmetric Factorials and its Application. Metrika 63, 243–255 (2006). https://doi.org/10.1007/s00184-005-0015-x
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DOI: https://doi.org/10.1007/s00184-005-0015-x