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Impedance spectroscopy study on Mn1+x Fe2−2x Ti x O4 (0⩽x⩽0.5) ferrites

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Abstract

The complex impedance spectroscopy and surface morphology of Mn1+x Fe2−2x Ti x O4 (0⩽x⩽0.5) system, prepared using a conventional solid state reaction technique, were investigated. The impedance spectroscopy measurements were carried out at room temperature in the frequency range of 42–5 MHz. The electrical processes in the samples were modeled in the form of an equivalent circuit made up of a combination of two parallel RC circuits attributed to grain and grain boundaries. The DC conductivity obtained by extrapolation of AC data using impedance spectroscopy and four-probe method increases at 10% doping of Ti ions. The energy-dispersive X-ray (EDX) pattern confirmed the homogeneous mixing of the Mn, Fe, Ti and O atoms in pure and doped ferrite samples.

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Authors and Affiliations

  1. School of Nano and Advanced Materials Engineering, Changwon National University, Changwon, 641-773, Korea

    S. Kumar, H. K. Choi, B. H. Koo & C. G. Lee

  2. King Abdullah Institute for Nanotechnology, King Saud University, Riyadh, 11451, Saudi Arabia

    K. M. Batoo

  3. Department of Mechanical Engineering, Changwon National University, Changwon, 641-773, Korea

    R. Prakash & J. I. Song

  4. Department of Precision & Mechanical Engineering and BK21 Eco-Friendly Heat & Cold Energy Mechanical Research Team, Gyeongsang National University, Tongyeong, 650-160, Korea

    H. Chung & H. Jeong

Authors
  1. S. Kumar
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  2. K. M. Batoo
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  3. R. Prakash
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  4. H. K. Choi
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  5. B. H. Koo
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  6. J. I. Song
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  7. H. Chung
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  8. H. Jeong
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  9. C. G. Lee
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Corresponding author

Correspondence to S. Kumar.

Additional information

Foundation item: Project supported by the Second Stage of Brain Korea 21 Project; Project(RTI04-01-03) supported by the Regional Technology Innovation Program of the Ministry of Knowledge Economy (MKE), Korea

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Kumar, S., Batoo, K.M., Prakash, R. et al. Impedance spectroscopy study on Mn1+x Fe2−2x Ti x O4 (0⩽x⩽0.5) ferrites. J. Cent. South Univ. Technol. 17, 1133–1138 (2010). https://doi.org/10.1007/s11771-010-0608-z

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  • DOI: https://doi.org/10.1007/s11771-010-0608-z

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