Skip to main content
Log in

Preserving Hamming Distance in Arithmetic and Logical Operations

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

This paper presents a new method for fault-tolerant computing where for a given error rate, r, the hamming distance between correct inputs and faulty inputs, as well as the hamming distance between correct results and faulty results, is preserved throughout processing; thereby enabling correction of up to r transient faults per computation cycle. The new method is compared and contrasted with current protection methods and its cost/performance is analyzed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3

Similar content being viewed by others

References

  1. Bell D, Laxton R (1975) Some BCH codes are optimal. Electronics letters 11:14

    Google Scholar 

  2. Blahut RE (1983) Theory and practice of error control codes, Addison-Wesley

  3. Cassel M, De Lima FG (2006) “Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs,” in Proc. of 12th IEEE International On-Line Testing Symposium, pp 139–144

  4. Chen W, Gong R, Liu F, Dai K, Wang Z (2006) “Improving the fault-tolerance of a computer system with space-time triple modular redundancy,” in Proc. of International Conference of Embedded Systems Applications, pp 183-190

  5. Dolev S and Frenkel S (2008) “Toward Hamming Processor,” Technical Report, #08-05, Dept. of Computer Science, Ben-Gurion University of the Negev

  6. Hass KJ, Gambles JW, Walker B, Zampaglione M (1998) “Mitigating single event upsets from combinational logic,” in Proc. of 7th NASA, Symposium on VLSI Design, vol. 4.1, pp. 1–10

  7. Hentschke R, Marques F, Lima F, Carro L, Susin A, Reis R (2002) Analyzing area and performance penalty of protecting different digital modules with hamming code and triple modular redundancy,” in Proc. of the 13h Symposium on Integrated Circuits and Systems Design, p. 95–100

  8. Jasinski R, Pedroni VA (2004) “Evaluating logic resources utilization in an FPGA-based TMR CPU,” in Proc. of the International Military and Aerospace Applications of Programmable Logic Devices, pp. 1005

  9. Lala K (2001) Self-checking and fault-tolerant digital design, Morgan Kaufmann

  10. Lima F, Cota E, Carro1 L, Lubaszewski M, Reis R, Velazco R, Rezgui S (2000) “Designing a radiation hardened 8051-like micro-controller,” in Proc. of 13th Symposium on Integrated Circuits and Systems Design, pp. 255–260

  11. Mavis DG, Eaton PH (2002) “Soft-error rate mitigation techniques for modern microcircuits,” in Proc. of 40th Annual Reliability Physics Symposium, pp. 216–225

  12. Nelson VP (1990) Fault-tolerant computing: fundamental concepts. IEEE Comput 23(7):19–25

    Article  Google Scholar 

  13. Nicolaidis M (2003) Carry checking/parity prediction adders and ALUs. IEEE Trans Very Large Scale Integr Syst 11(1):121–128

    Article  Google Scholar 

  14. Reyhani-Masoleh A, Hasan MA (2004) Low complexity bit parallel architectures for polynomial basis multiplication over GF(2m). IEEE Trans Comput 53(8):945–959

    Article  Google Scholar 

  15. Spielman D (1996) “Highly Fault-Tolerant Parallel Computation,” in Proc. of the 37th IEEE Annual Symposium on Foundations of Computer Science, pp. 154–163

  16. Xin L, Shen K, Huang MC, and Chu L (2007 “A Memory soft-error measurement on production systems,” in Proc. of USENIX Annual Technical Conference, pp. 275–280

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Sergey Frenkel.

Additional information

Responsible Editor: K. Saluja

Rights and permissions

Reprints and permissions

About this article

Cite this article

Dolev, S., Frenkel, S., Tamir, D.E. et al. Preserving Hamming Distance in Arithmetic and Logical Operations. J Electron Test 29, 903–907 (2013). https://doi.org/10.1007/s10836-013-5421-9

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-013-5421-9

Keywords

Navigation