CeO2/YSZ/CeO2 buffer layers were deposited on textured Ni substrates by in situ pulsed laser deposition. The out-of-plane texture and in-plane texture of the buffer layers were characterized by X-ray diffraction ω-scans and ϕ-scans. Using this CeO2/YSZ/CeO2 architecture as the buffer layers, high quality YBCO films with a zero-resistance T c about 90 K and a self-field critical current densities J c above 106 A/cm2 at 77 K can be obtained on Ni substrates.
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ACKNOWLEDGMENTS
This work was supported by the High tech Research and Development (863) Program of China.
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Liu, Z., Wang, S.F., Zhao, S.Q. et al. Epitaxial Growth of CeO2/YSZ/CeO2 Buffer Layers on Textured Ni Substrates for YBCO Conductors. J Supercond 18, 537–540 (2005). https://doi.org/10.1007/s10948-005-0038-6
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DOI: https://doi.org/10.1007/s10948-005-0038-6