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Efficient registration for precision inspection of free-form surfaces

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Abstract

Precision inspection of free-form surface is difficult with current industry practices that rely on accurate fixtures. Alternatively, the measurements can be aligned to the part model using a geometry-based registration method, such as the iterative closest point (ICP) method, to achieve a fast and automatic inspection process. This paper discusses various techniques that accelerate the registration process and improve the efficiency of the ICP method. First, the data structures of approximated nearest nodes and topological neighbor facets are combined to speed up the closest point calculation. The closest point calculation is further improved with the cached facets across iteration steps. The registration efficiency can also be enhanced by incorporating signal-to-noise ratio into the transformation of correspondence sets to reduce or remove the noise of outliers. Last, an acceleration method based on linear or quadratic extrapolation is fine-tuned to provide the fast yet robust iteration process. These techniques have been implemented on a four-axis blade inspection machine where no accurate fixture is required. The tests of measurement simulations and inspection case studies indicated that the presented registration method is accurate and efficient.

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Abbreviations

BIM:

Blade inspection machine

CAD:

Computer aided design

CMM:

Coordinate measuring machine

ICP:

Iterate closest point

MCS:

Measurement coordinate system

PCS:

Part coordinate system

RMS:

Root mean square

SNR:

Signal to noise ratio

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Acknowledgement

The authors thank Neil Craft from Williams International Co. for providing the physical parts and geometry models used in this paper.

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Authors and Affiliations

  1. NSF Engineering Research Center for Reconfigurable Manufacturing Systems, College Of Engineering, University Of Michigan, 2250 G.G. Brown Building, 2350 Hayward Street, Ann Arbor, MI, 48109-2125, USA

    Liang Zhu, Jacob Barhak, Vijay Srivatsan & Reuven Katz

Authors
  1. Liang Zhu
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  2. Jacob Barhak
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  3. Vijay Srivatsan
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  4. Reuven Katz
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Corresponding author

Correspondence to Liang Zhu.

Additional information

This work was supported primarily by the NSF Engineering Research Center for Reconfigurable Manufacturing Systems as part of the Engineering Research Centers Program of the National Science Foundation under NSF Award Number EEC 95-29125.

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Zhu, L., Barhak, J., Srivatsan, V. et al. Efficient registration for precision inspection of free-form surfaces. Int J Adv Manuf Technol 32, 505–515 (2007). https://doi.org/10.1007/s00170-005-0370-9

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  • DOI: https://doi.org/10.1007/s00170-005-0370-9

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