Abstract
The surface recombination velocityS=U/n is defined as the ratio between the surface recombination current densityU and the excess minority carrier concentrationn at the semiconductor surface. Measurements of injection-dependent surface recombination velocities apply modulation techniques, and thus, in reality, a differential surface recombination velocityS diff=dU/dn is determined. The significance to distinguishS andS diff when evaluating measurements is shown.
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Brendel, R. Note on the interpretation of injection-level-dependent surface recombination velocities. Appl. Phys. A 60, 523–524 (1995). https://doi.org/10.1007/BF01538780
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DOI: https://doi.org/10.1007/BF01538780