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Microscopic Optical Beam Profile Measurement Technique for Near-Infrared Light by Using a Scanning Thermal Probe

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Abstract

In this paper, we report that the beam profile of the near-infrared light from superluminescent diodes (SLDs) can be measured with a resolution below the diffraction limit by using the photothermal effect and scanning thermal microscopy (SThM). Due to the sub-diffraction resolution of SThM, the beam profile measured using SThM was much clearer than the beam profile obtained by using the knife-edge method. By stacking cross-sectional images of the optical beam profile obtained by using SThM, we were able to obtain successively the three-dimensional optical beam profile. Our novel method of using small probes to measure optical beam profiles is compatible with conventional microscopy systems and can potentially be used in various applications.

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Acknowledgments

This work was supported by Incheon National University Research Grant in 2017.

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Author notes

  1. These authors contributed equally to this work.

Authors and Affiliations

  1. Department of Physics, Incheon National University, Incheon, 22012, Korea

    Hyuntae Kim & Soobong Choi

  2. Intelligent Sensor Convergence Research Center (ISCRC), Incheon National University, Incheon, 22012, Korea

    Woongkyu Park

  3. Park Systems Corporation, KANC 4F, Suwon, 16229, Korea

    Sangjoon Cho & Cheolsu Kim

Authors
  1. Hyuntae Kim
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  2. Soobong Choi
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  3. Woongkyu Park
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  4. Sangjoon Cho
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  5. Cheolsu Kim
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Corresponding author

Correspondence to Soobong Choi.

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Kim, H., Choi, S., Park, W. et al. Microscopic Optical Beam Profile Measurement Technique for Near-Infrared Light by Using a Scanning Thermal Probe. J. Korean Phys. Soc. 77, 912–915 (2020). https://doi.org/10.3938/jkps.77.912

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  • DOI: https://doi.org/10.3938/jkps.77.912

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