Skip to main content
Log in

Ovonic threshold switching selectors for three-dimensional stackable phase-change memory

  • Phase-Change Materials in Electronics and Photonics
  • Published:
MRS Bulletin Aims and scope Submit manuscript

Abstract

High-current switching performance of ovonic threshold switching (OTS) selectors have successfully enabled the commercialization of high-density three-dimensional (3D) stackable phase-change memory in Intel’s 3D Xpoint technology. This bridges the huge performance gap between dynamic random access memory (DRAM) and Flash. Similar to phase-change memory, OTS uses chalcogenide-based materials, but whereas phase-change memory reversibly switches between a high-resistance amorphous phase and a low-resistance crystalline phase, OTS freezes in the amorphous phase. In this article, we review recent developments in OTS materials and their performance in devices, especially current density and selectivity. Advantages and challenges of OTS devices in the integration with the phase-change memory are discussed. We introduce the evolution of theoretical models for explaining the OTS behavior, including thermal runaway, field-induced nucleation, and generation/recombination of charge carriers.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Figure 1
Figure 2
Figure 3
Figure 4

Similar content being viewed by others

References

  1. G. Burr, M.J. Breitswisch, M. Franceschini, D. Garetto, K. Gopalakrishnan, B. Jackson, B. Kurdi, C. Lam, L.A. Lastras, A. Padilla, B. Rajendran, S. Raoux, R.S. Shenory, J. Vac. Sci. Technol. B 28, 223 (2010).

    Article  CAS  Google Scholar 

  2. M. Zhu, Ti-Sb-Te Phase Change Materials: Component Optimization, Mechanism and Applications (Springer Nature, Singapore, 2017).

  3. W. Zhang, R. Mazzarello, M. Wuttig, E. Ma, Nat. Rev. Mater. 4, 150 (2019).

    Article  CAS  Google Scholar 

  4. G.W. Burr, B.N. Kurdi, J.C. Scott, C.H. Lam, K. Gopalakrishnan, R.S. Shenoy, IBM J. Res. Dev. 52, 449 (2008).

    Article  Google Scholar 

  5. R.F. Freitas, W.W. Wicke, IBM J. Res. Dev. 52, 439 (2008).

    Article  Google Scholar 

  6. M. Zhu, M. Xia, F. Rao, X. Li, L Wu, X. Ji, S. Lv, Z. Song, S. Feng, H. Sun, S. Zhang, Nat. Commun. 5, 4086 (2014).

    Article  CAS  Google Scholar 

  7. M. Salinga, B. Kersting, I. Ronneberger, V.P. Jonnalagadda, X.T. Vu, M.L. Gallo, I. Giannopoulos, O.C. Miredin, R. Mazzarello, A. Sebastian, Nat. Mater. 17, 681 (2018).

    Article  CAS  Google Scholar 

  8. M. Wuttig, N. Yamada, Nat. Mater. 6, 824 (2007).

    Article  CAS  Google Scholar 

  9. J. Shen, S. Lv, X. Chen, T. Li, S. Zhang, Z. Song, M. Zhu, ACS Appl. Mater. Interfaces 7, 7627 (2015).

    Article  CAS  Google Scholar 

  10. F. Rao, K. Ding, Y. Zhou, Y. Zheng, M. Xia, S. Lv, Z. Song, S. Feng, I. Ronneberger, R. Mazzarello, W. Zhang, E. Ma, Science 358, 1423 (2017).

    CAS  Google Scholar 

  11. Intel Corporation, Intel Optane Technology https://www.intel.com/content/www/us/en/architecture-and-technology/intel-optane-technology.html (2015).

  12. J. Choe, “Intel 3D XPoint Memory Die Removed from Intel Optane PCM (Phase Change Memory),” TechInsights, http://www.techinsights.com/abouttechinsights/overview/blog/intel-3D-xpoint-memorydie-removed-from-inteloptane-pcm (2017).

  13. G.W. Burr, R.S. Shenoy, K. Virwani, P. Narayanan, A. Padilla, B. Kurdi, H. Hwang, J. Vac. Sci. Technol. B 32, 040802 (2014).

    Article  CAS  Google Scholar 

  14. J.H. Oh, J.H. Park, Y.S. Lim, H.S. Lim, Y.T. Oh, J.S. Kim, J.M. Shin, J.H. Park, Y.J. Song, K.C. Ryoo, D.W. Lim, S.S. Park, J.I. Kim, J.H. Kim, J. Yu, F. Yeung, C.W. Jeong, J.H. Kong, D.H. Kang, G.H. Koh, G.T. Jeong, H.S. Jeong, K. Kim, IEDM Tech. Dig. 1 (2006).

  15. G. Servalli, IEDM Tech. Dig. 5.7.1 (2009).

  16. D. Kau, S. Tang, I.V. Karpov, R. Dodge, B. Klehn, J.A. Kalb, J. Strand, A. Diaz, N. Leung, J. Wu, S. Lee, T. Langtry, K. Chang, C. Papagianni, J. Lee, J. Hirst, S. Erra, E. Flores, N. Righos, H. Castro, G. Spadini, IEDM Tech. Dig. 27.1.1 (2009).

  17. M. Son, J. Lee, J. Park, J. Shin, G. Choi, S. Jung, W. Lee, S. Kim, S. Park, H. Hwang, IEEE Electron Device Lett. 32, 1579 (2011).

    Article  CAS  Google Scholar 

  18. M. Kund, G. Beitel, C. Pinnow, T. Röhr, J. Schumann, R. Symanczyk, K. Ufert, G. Müller, IEDM Tech. Dig. 754 (2005).

  19. S.H. Jo, T. Kumar, S. Narayanan, W.D. Lu, H. Nazarian, IEDM Tech. Dig. 6.7.1 (2014).

  20. N. Yamada, E. Ohno, K. Nishiuchi, N. Akahira, M. Takao, J. Appl. Phys. 69, 2849 (1991).

    Article  CAS  Google Scholar 

  21. M. Xu, Y.Q. Cheng, L. Wang, H.W. Sheng, Y. Meng, W.G. Yang, X.D. Han, E. Ma, Proc. Natl. Acad. Sci. U.S.A. 109, E1055 (2012).

    Article  CAS  Google Scholar 

  22. S. Lee, D. Ko, Y. Jung, R. Agarwai, Appl. Phys. Lett. 89, 223116 (2006).

    Article  CAS  Google Scholar 

  23. M. Anbarasu, M. Wimmer, G. Bruns, M. Salinga, M. Wuttig, Appl. Phys. Lett. 100, 143505 (2012).

    Article  CAS  Google Scholar 

  24. M. Zhu, O.C. Mirédin, A.M. Mio, J. Keutgen, M. Küpers, Y. Yu, J.-Y. Cho, R. Dronskowski, M. Wuttig, Adv. Mater. 30, 1706735 (2018).

    Article  CAS  Google Scholar 

  25. J. Pries, O. Cojocaru-Mirédin, M. Wuttig, MRS Bull. 44 (9), 699 (2019).

    Article  Google Scholar 

  26. W.R. Noverthover, A.D. Pearson, US Patent 3117013 (1964).

  27. S.R. Ovshinsky, US Patent 3271591 (1966).

  28. S.R. Ovshinsky, Phys. Rev. Lett. 22, 1450 (1968).

    Article  Google Scholar 

  29. D.L. Nelson, J. Non Cryst. Solids 2, 528 (1970).

    Article  Google Scholar 

  30. M. Anbarasu, S. Asokan, J. Appl. Phys. 109, 084517 (2011).

    Article  CAS  Google Scholar 

  31. A. Manivannan, S.K. Myana, K. Miriyala, S. Sahu, R. Ramadura, Appl. Phys. Lett. 105, 243501 (2014).

    Article  CAS  Google Scholar 

  32. M.-J. Lee, D. Lee, H. Kim, H.-S. Choi, J.-B. Park, H.G. Kim, Y.-K. Cha, U-I. Chung, I.-K. Yoo, K. Kim, IEDM Tech. Dig. 2.6.1 (2012).

  33. M.-J. Lee, D. Lee, S.-H. Cho, J.-H. Hur, S.-M. Lee, D.H. Seo, D.-S. Kim, M.-S. Yang, S. Lee, E. Hwang, M.R. Uddin, H. Kim, U.I. Chung, Y. Park, I.K. Yoo, Nat. Commun. 4, 2629 (2013).

    Article  CAS  Google Scholar 

  34. A. Velea, K. Opsomer, W. Devulder, J. Dumortier, J. Fan, C. Detavernier, M. Jurczak, B. Govoreanu, Sci. Rep. 7, 8103 (2017).

    Article  CAS  Google Scholar 

  35. J. Yoo, D. Lee, J. Park, J. Song, H. Hwang, IEEE J. Electron Devices Soc. 6, 821 (2018).

    Article  CAS  Google Scholar 

  36. S.A. Chekol, J. Yoo, J. Park, J. Song, C. Sung, H. Hwang, Nanotechnology 29, 345202 (2018).

    Article  CAS  Google Scholar 

  37. S.-D. Kim, H.-W. Ahn, S.Y. Shin, D.S. Jeong, S.H. Son, H. Lee, B.-K. Cheong, D.W. Shin, S. Leea, ECS Solid State Lett. 2, Q75 (2013).

    Article  CAS  Google Scholar 

  38. S.-Y. Shin, J.M. Choi, J. Seo, H.-W. Ahn, Y.G. Choi, B.-K. Cheong, S. Lee, Sci. Rep. 4, 7099 (2014).

    Article  Google Scholar 

  39. B. Govoreanu, G.L. Donadio, K. Opsomer, W. Devulder, V.V. Afanas’ev, T. Witters, S. Clima, N.S. Avasarala, A. Redolfi, S. Kundu, O. Richard, D. Tsvetanova, G. Pourtois, C. Detavernier, L. Goux, G.S. Kar, Symposium on VLSI Technology (Kyoto, Japan, 2017), p. T92.

  40. A. Verdy, G. Navarro, V. Sousa, P. Noé, M. Bernard, F. Fillot, G. Bourgeois, J. Garrione, L. Perniola, International Memory Workshop (2017), p. 1.

  41. G. Navarro, A. Verdy, N. Castellani, G. Bourgeois, V. Sousa, G. Molas, M. Bernard, C. Sabbione, P. Noé, J. Garrione, L. Fellouh, L. Perniola, Symposium on VLSI Technology (Kyoto, Japan, 2017), p. T94.

  42. M. Alayan, E. Vianello, G. Navarro, C. Carabasse, S. La Barbera, A. Verdy, N. Castellani, A. Levisse, G. Molas, L. Grenouillet, T. Magis, F. Aussenac, M. Bernard, B. DeSalvo, J.M. Portal, E. Nowak, IEDM Tech. Dig. 2.3.1 (2017).

  43. N.S. Avasarala, G.L. Donadio, T. Witters, K. Opsomer, B. Govoreanu, A. Fantini, S. Clima, H. Oh, S. Kundu, W. Devulder, M.H. van der Veen, J. Van Houdt, M. Heyns, L. Goux, G.S. Kar, Symposium on VLSI Technology (Honolulu, 2018), p. 209.

  44. H.Y. Cheng, W.C. Chien, I.T. Kuo, C.W. Yeh, L. Gignac, W. Kim, E.K. Lai, Y.F. Lin, R.L. Bruce, C. Lavoie, C.W. Cheng, A. Ray, F.M. Lee, F. Carta, C.H. Yang, M.H. Lee, H.Y. Ho, M. BrightSky, H.L. Lung, IEDM Tech. Dig. 37.3.1 (2018).

  45. H.Y. Cheng, W.C. Chien, I.T. Kuo, E.K. Lai, Y. Zhu, J.L. Jordan-Sweet, A. Ray, F. Carta, F.M. Lee, P.H. Tseng, M.H. Lee, Y.Y. Lin, W. Kim, R. Bruce, C.W. Yeh, C.H. Yang, M. BrightSky, H.L. Lung, IEDM Tech. Dig. 2.2.1 (2017).

  46. S. Kim, Y.-B. Kim, K.M. Kim, S.-J. Kim, S.R. Lee, M. Chang, E. Cho, M.-J. Lee, D. Lee, C.J. Kim, U-I. Chung, I.-K. Yoo, Symposium on VLSI Technology (Kyoto, Japan, 2013), p. T240.

  47. Y. Koo, K. Bak, H. Hwang, Symposium on VLSI Technology (Kyoto, Japan, 2016), p. 1.

  48. A. Verdy, G. Navarro, M. Bernard, S. Chevalliez, N. Castellani, E. Nolot, J. Garrione, P. Noé, G. Bourgeois, V. Sousa, M.-C. Cyrille, E. Nowak, International Reliability Physics Symposium (2018), p. 6D.4.1.

  49. J.H. Lee, G.H. Kim, Y.B. Ahn, J.W. Park, S.W. Ryu, C.S. Hwang, H.J. Kim, Appl. Phys. Lett. 100, 123505 (2012).

    Article  CAS  Google Scholar 

  50. S. Kim, H.-D. Ki, S.-J. Choi, J. Alloys Compd. 667, 91 (2016).

    Article  CAS  Google Scholar 

  51. Y. Koo, H. Hwang, Sci. Rep. 8, 11822 (2018).

    Article  CAS  Google Scholar 

  52. A. Verdy, G. Navarro, M. Bernard, P. Noé, C. Licitra, G. Bourgeois, J. Garrione, M.C. Cyrille, V. Sousa, E. Nowak, International Memory Workshop (2017), pp. 1–4.

  53. B. Bez., IEDM Tech. Dig. 5.1.1 (2009).

  54. D.M. Kroll, Phys. Rev. B 9, 1669 (1974).

    Article  CAS  Google Scholar 

  55. D.M. Kroll, Phys. Rev. B 11, 3814 (1975).

    Article  CAS  Google Scholar 

  56. T. Kaplan, D. Adler, Appl. Phys. Lett. 19, 418 (1971).

    Article  CAS  Google Scholar 

  57. V.G. Karpov, Y.A. Kryukov, S.D. Savransky, I.V. Parpov, Appl. Phys. Lett. 90, 123504 (2007).

    Article  CAS  Google Scholar 

  58. V.G. Karpov, Y.A. Kryukov, I.V. Karpov, M. Mitra, Phys. Rev. B 78, 052201 (2008).

    Article  CAS  Google Scholar 

  59. M. Zhu, M. Xia, Z. Song, Y. Cheng, L. Wu, F. Rao, S. Song, M. Wang, Y. Lu, S. Feng, Nanoscale 7, 9935 (2015).

    Article  CAS  Google Scholar 

  60. S. Menzel, U. Bottger, M. Wimmer, M. Salinga, Adv. Funct. Mater. 25, 6306 (2015).

    Article  CAS  Google Scholar 

  61. K. Ren, M. Zhu, W. Song, S. Lv, M. Xia, Y. Wang, Y. Lu, Z. Ji, Z. Song, Nanoscale 11, 1595 (2019).

    Article  CAS  Google Scholar 

  62. D. Adler, M.S. Shur, M. Silver, S.R. Ovshinsky, J. Appl. Phys. 51, 3289 (1980).

    Article  CAS  Google Scholar 

  63. W. Czubatyj, S.J. Hudgens, Electron. Mater. Lett. 8, 157 (2012).

    Article  CAS  Google Scholar 

  64. A. Pirovano, A.L. Lacaita, A. Benvenuti, F. Pellizzer, R. Bez, IEEE Trans. Electron Devices 51, 452 (2004).

    Article  Google Scholar 

  65. A. Redaelli, A. Pirovno, A. Benvenuti, A.L. Lacaita, J. Appl. Phys. 103, 111101 (2008).

    Article  CAS  Google Scholar 

  66. D. Ielmini, Y. Zhang, J. Appl. Phys. 102, 054517 (2007).

    Article  CAS  Google Scholar 

  67. S. Clima, B. Govoreanu, K. Opsomer, A. Velea, N.S. Avasarala, W. Devulder, I. Shlyakhov, G.L. Donadio, T. Witters, S. Kundu, L. Goux, V. Afanasiev, G.S. Kar, G. Pourtois, IEDM Tech. Dig. 4.1.1 (2017).

Download references

Acknowledgments

This work is supported by the National Key Research and Development Program of China (2017YFB0206101), the Strategic Priority Research Program of the Chinese Academy of Sciences (XDPB12), and the National Natural Science Foundation of China (61504157). M. Zhu acknowledges support by the Hundred Talents Program (Chinese Academy of Sciences) and Shanghai Pujiang Talent Program (18PJ1411100).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Min Zhu.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Zhu, M., Ren, K. & Song, Z. Ovonic threshold switching selectors for three-dimensional stackable phase-change memory. MRS Bulletin 44, 715–720 (2019). https://doi.org/10.1557/mrs.2019.206

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/mrs.2019.206

Navigation