Abstract
Thin SnO2–x layers, 30 nm in thickness, are produced by the thermal oxidation of metal tin nanolayers at a temperature of 450–750°C. The electrical and optical properties of the layers are studied. During the thermal oxidation of tin nanolayers, an unsteady variation in their conductivity is observed. For the oxide films produced at 450 and 550°C, an absorption band at 340 nm (3.65 eV) is detected in the optical spectra. The conductivity-activation energy is determined for samples oxidized to different degrees. On the basis of experimental data and the data reported in publications, an oxidation mechanism controlling the properties of Sn nanolayers is proposed.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
M. Batzill and U. Diebold, Progr. Surf. Sci. 79, 47 (2005).
Yu. A. Yurakov, S. V. Ryabtsev, O. A. Chuvenkova, S. Yu. Turishchev, E. P. Domashevskaya, S. B. Kushchev, and S. V. Kannykin, Kristallografiya 57, 934 (2012).
Y. A. Yurakov, S. V. Ryabtsev, O. A. Chuvenkova, E. P. Domashevskaya, A. S. Nikitenko, S. V. Kannykin, and S. B. Kushchev, Crystallogr. Rep. 54, 110 (2009).
N. Cabrera and N. F. Mott, Rep. Progr. Phys. 12, 163 (1948).
C. Wagner, Science 13, 23 (1973).
Metal Oxide Nanomaterials for Chemical Sensors, Ed. by M. A. Carpenter, S. Mathur, and A. Kolmakov (Springer, New York, 2013).
S. Samson and C. G. Fonstad, J. Appl. Phys. 44, 4618 (1973).
C. G. Fonstad and R. H. Rediker, J. Appl. Phys. 42, 2911 (1971).
C. Kilic and A. Zunger, Phys. Rev. Lett. 88, 095501 (2002).
Y. S. He, J. C. Campbell, R. C. Murphey, N. F. Arendt, and J. S. Swinnea, J. Mater. Res. 8, 3131 (1993).
K. P. Bogdanov, D. P. Dmitrov, O. F. Lutskaya, and Yu. M. Tairov, Semiconductors 32, 1033 (1998).
D. A. Popescu, J.-M. Herrmann, A. Ensuquea, and F. Bozon-Verduraz, Phys. Chem. Chem. Phys. 3, 2522 (2001).
X. Wu, B. Zou, J. Xu, B. Yu, G. Tang, G. Zhang, and W. Chen, Nanostruct. Mater. 8, 179 (1997).
Y. Mizokawa and S. Nakamura, Jpn. J. Appl. Phys. 14, 779 (1975).
E. P. Domashevskaya, S. V. Ryabtsev, E. A. Tutov, Yu. A. Yurakov, O. A. Chuvenkova, and A. N. Lukin, Tech. Phys. Lett. 32, 782 (2006).
M. C. Wu, C. M. Truong, and D. W. Goodman, Phys. Rev. B 46, 12688 (1992).
V. I. Avdeev and G. M. Zhidomirov, Zh. Strukt. Khim. 44, 995 (2003).
V. A. Shvets, A. V. Kuznetsov, V. A. Fenin, and V. B. Kazansky, J. Chem. Soc. Faraday Trans. 81, 2913 (1985).
A. Kolmakov, Y. Zhang, and M. Moskovits, Nano Lett. 3, 1125 (2003).
T. Kobayashi, Y. Kimura, H. Suzuki, T. Sato, T. Tanigaki, Y. Saitob, and C. Kaito, J. Cryst. Growth 243, 143 (2002).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © S.V. Ryabtsev, O.A. Chuvenkova, S.V. Kannykin, A.E. Popov, N.S. Ryabtseva, S.S. Voischev, S.Yu. Turishchev, E.P. Domashevskaya, 2016, published in Fizika i Tekhnika Poluprovodnikov, 2016, Vol. 50, No. 2, pp. 180–184.
Rights and permissions
About this article
Cite this article
Ryabtsev, S.V., Chuvenkova, O.A., Kannykin, S.V. et al. On the electrical and optical properties of oxide nanolayers produced by the thermal oxidation of metal tin. Semiconductors 50, 180–184 (2016). https://doi.org/10.1134/S1063782616020214
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782616020214