Abstract
A reflection interferometer based on a thin metal film is proposed to measure the phase of the reflection spectrum of laser mirrors. The device is applied to the study of the phase characteristics of the all-semiconductor mirror which combines the functions of the saturable absorber and the dispersion compensator (all-in-one) in the Nd3+:KGd(WO4)2 laser operating in the ultrashort-pulse regime. The method provides improvement of spectral resolutions and an increase in the accuracy in the measurement of the phase characteristics.
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Original Text © Astro, Ltd., 2007.
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Kovalyov, A.A., Pchelyakov, O.P., Preobrazhenskii, V.V. et al. A new technique to measure the phase characteristics of laser mirrors based on semiconductor heterostructures. Laser Phys. 17, 478–481 (2007). https://doi.org/10.1134/S1054660X07040275
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DOI: https://doi.org/10.1134/S1054660X07040275