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Wideband Low-Reflection Inhomogeneous Dielectric Structures

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Radiophysics and Quantum Electronics Aims and scope

We consider reflection of electromagnetic waves from two-layer dielectric films with finite thickness, whose refractive indices vary in the direction of wave propagation, which is perpendicular to the substrate boundary. The profiles of the refractive indices of the structures having low reflection coefficients in a wide frequency range are found. The obtained results are based on exact analytical solutions of the Helmholtz equation for one type of the layered inhomogeneous dielectric medium. The possibility of creating new low-reflection wideband inhomogeneous dielectric structures is demonstrated.

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Authors and Affiliations

  1. N. I. Lobachevsky State University of Nizhny Novgorod, Scientific & Production Enterprise “Polyot”, Nizhny Novgorod, Russia

    N. A. Denisova & A. V. Rezvov

Authors
  1. N. A. Denisova
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  2. A. V. Rezvov
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Correspondence to N. A. Denisova.

Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 60, No. 3, pp. 250–259, March 2017.

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Denisova, N.A., Rezvov, A.V. Wideband Low-Reflection Inhomogeneous Dielectric Structures. Radiophys Quantum El 60, 224–232 (2017). https://doi.org/10.1007/s11141-017-9793-z

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  • DOI: https://doi.org/10.1007/s11141-017-9793-z

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