Abstract
The transient thermal distribution and thermally induced beam quality (M 2) degradation in low repetition (10 Hz) and hundred-mJ-level end-pumped Yb:YAG slab amplifiers with different thicknesses are discussed. Using Fast Fourier Transformation, the output beam quality is evaluated for different pump conditions, including variable pump power, single- or double-end pumping, and different pump beam widths. Simulation results show that for a slab amplifier operating at low repetition rates and high pump energy levels, adequate thermal property and output beam quality can be achieved by simply increasing the slab thickness.
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Acknowledgements
This work was supported by the National Key Scientific and Research Equipment Development Project of China (No. ZDYZ2013-2), the China Innovative Talent Promotion Plans for Innovation Team in Priority Fields (No. 2014RA4051), the National Natural Science Foundation of China (No.61605214) and the Innovation Program of Academy of Opto-Electronics, Chinese Academy of Science (No. Y70B06A13Y).
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Lang, Y., Xin, J., Alameh, K. et al. Simulation of the transient thermally induced beam quality degradation in end-pumped slab Yb:YAG amplifiers of hundred-mJ-level. Appl. Phys. B 123, 231 (2017). https://doi.org/10.1007/s00340-017-6807-7
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DOI: https://doi.org/10.1007/s00340-017-6807-7