Abstract
A prototype study on active phase locking of a tiled two-grating assembly (TTGA) using four electronic nanometric actuators has been reported, for its use in high-energy laser pulse compression. Measurement and correction of various phase errors of a TTGA have been demonstrated with a precision of sub-50 nm in differential longitudinal translational and sub-10 µrad in differential angular errors using controls derived from simultaneous recording of laser interferogram and far-field profiles of reflected and diffracted beams from TTGA differentiating in-plane rotation with respect to tip error, which is otherwise difficult in the case of using interferometry alone. Multiple-level intensities in the thresholds of the power spectra of apodized interferogram and far-field profiles have been adapted to estimate spatial frequencies and beam peak positions with sub-pixel accuracies.
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Acknowledgements
The author gratefully acknowledges the support given by the Laser Electronics Support Division of RRCAT Indore for carrying out the developmental work presented in this paper.
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Sharma, A.K., Joshi, A.S., Naik, P.A. et al. Active phase locking of a tiled two-grating assembly for high-energy laser pulse compression using simultaneous controls from far-field profiles and interferometry. Appl. Phys. B 123, 117 (2017). https://doi.org/10.1007/s00340-017-6682-2
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DOI: https://doi.org/10.1007/s00340-017-6682-2