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Scanning Electron-Probe Microanalysis In The Metals Industry

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Abstract

Typical applications of the scanning microana-lyzer to the analysis of multiphase structures and compositional heterogeneity encountered in commercial materials are discussed. Instrumental considerations of the microanalyzer which improve image quality, increase analytical speed, and permit analyzing rough surfaces are described and the results are illustrated.

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References

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Authors and Affiliations

  1. Research Div., Crucible Steel Co. of America, Pittsburgh, USA

    B. R. Banerjee (member of AIME, supervisor of Basic Research and Applied Physics Section), W. D. Bingle (staff physicist and microanalyst) & N. S. Blake (staff physicist and microanalyst)

Authors
  1. B. R. Banerjee
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  2. W. D. Bingle
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  3. N. S. Blake
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Banerjee, B.R., Bingle, W.D. & Blake, N.S. Scanning Electron-Probe Microanalysis In The Metals Industry. JOM 15, 769–773 (1963). https://doi.org/10.1007/BF03397250

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  • DOI: https://doi.org/10.1007/BF03397250

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