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A sensitive thrust-measuring device

A cantilevered beam with mounted strain gages is used to indirectly measure the velocity of a stream of drops by measuring the thrust produced by this stream

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Abstract

A centilevered beam with mounted strain gages is used to indirectly measure the velocity of a stream of drops by measuring the thrust produced by this stream. A design procedure is explained and implemented to determine a suitable geometry for this device. Sensitivity, frequency response and fragility are the factors considered in the design. Laboratory-test results show the usefulness of this device.

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Abbreviations

b :

width of cantilever (in.)

C 1 :

correction factor to account for the thickness of gage cement

D :

diameter of stream emanating from drop generator (in.)

E :

modulus of elasticity of beam material (psi)

E 0 :

excitation voltage to bridge circuit (V)

f :

frequency of drops (drops/s)

F :

force on cantilever beam (lb)

F 0 :

gage factor of strain gages

h :

thickness of cantilever (in.)

I :

distance to point of force application from gage location (in.)

L :

length of beam (in.)

V :

velocity of drops (in./s)

V 0 :

bridge output voltage (V)

α:

ratio of static deflection to beam length

γ:

weight density of material of cantilever (lb/in.3)

λ:

drop to drop spacing (in.)

ρ:

density of fluid (lb-s2/in.4)

ρs :

density of material of cantilever (lb-s2/in.4)

References

  1. Rayleigh, J. W. S., The Theory of Sound,11,Ch. XX, Dover Publications (1945).

  2. Streeter, Victor L., Fluid Mechanics, Ch. 3, McGraw-Hill (1958).

  3. Sweet, R., “High Frequency Oscillography with Electrostatically Reflected Ink Jets,” TR 1722-1, Stanford Elec. Lab. (1964).

  4. Spotts, M. F., Design of Machine Elements, Ch. 1, Prentice Hall (1961).

  5. Perry, C. C., and Lissner, H. R., The Strain Gage Primer, Ch. 4, McGraw-Hill (1962).

  6. Timoshenko, S., Vibration Problems in Engineering, Ch. 5, Van Nostrand (1955).

  7. Wilfinger, R. J., et al., The Resonistor: A Frequency Selective Device Utilizing the Mechanical Resonances of a Silicon Substrate,IBM Journal of Research and Development,12, (1) (January 1968).

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Authors and Affiliations

  1. System Development Division, IBM Corporation, 13760, Endicott, NY

    J. L. Zable

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  1. J. L. Zable
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Zable, J.L. A sensitive thrust-measuring device. Experimental Mechanics 15, 365–368 (1975). https://doi.org/10.1007/BF02318878

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  • DOI: https://doi.org/10.1007/BF02318878

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