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Examination of several selected fungi by scanning electron microscope

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Abstract

Scanning electron microscopy with high resolution and great depth of focus has been known to be able to show the fine features of surface ornamentation of fungi, and with this technique we could obtain the interesting results about the surface structures of the selected fungi,Penicillium chrysogenum, Aspergillus niger, Aspergillus oryzae andCandida utilis.

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References

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Authors and Affiliations

  1. Department of Biochemistry, Gifu University School of Medicine, Gifu, Japan

    Yuki Ito & Yoshinori Nozawa

  2. Department of Anatomy, Gifu University School of Medicine, Tsukasa-machi 40, Gifu, Japan

    Takao Setoguti

Authors
  1. Yuki Ito
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  2. Yoshinori Nozawa
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  3. Takao Setoguti
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Ito, Y., Nozawa, Y. & Setoguti, T. Examination of several selected fungi by scanning electron microscope. Mycopathologia et Mycologia Applicata 41, 299–305 (1970). https://doi.org/10.1007/BF02051109

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  • DOI: https://doi.org/10.1007/BF02051109

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