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In Situ SXS and XAFS Measurements of Electrochemical Interface

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X-ray and Neutron Techniques for Nanomaterials Characterization

Abstract

In this chapter, we focus on structural studies at electrode/electrolyte solution interfaces by means of surface x-ray scattering (SXS) and x-ray absorption fine structure (XAFS) measurements using synchrotron radiation (SR) light as an x-ray source. After describing the importance of these techniques for structural studies at the electrode/electrolyte interface as an introduction, we explain the fundamental principles and experimental methodologies of these techniques. Finally, we describe trends in the development of these techniques and review the latest topics.

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Authors and Affiliations

  1. Global Research Center for Environment and Energy based on Nanomaterials Science (GREEN), National Institute for Materials Science (NIMS), Tsukuba, 305-0044, Japan

    Toshihiro Kondo, Takuya Masuda & Kohei Uosaki

  2. Graduate School of Humanities and Sciences, Ochanomizu University, Bunkyo-ku, Tokyo, 112-8610, Japan

    Toshihiro Kondo

  3. Advanced Key Technologies Division, National Institute for Materials Science (NIMS), Tsukuba, 305-0044, Japan

    Takuya Masuda

  4. Precursory Research for Embryonic Science and Technology (PRESTO), Japan Science and Technology Agency (JST), 333-0012, Kawaguchi, Japan

    Takuya Masuda

  5. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, 305-0044, Japan

    Kohei Uosaki

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  1. Toshihiro Kondo
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Correspondence to Kohei Uosaki .

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  1. Integrated Mesoscale Architectures for Sustainable Catalysis (IMASC), Rowland Institute of Science, Harvard University, Cambridge, Massachusetts, USA

    Challa S.S.R. Kumar

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Kondo, T., Masuda, T., Uosaki, K. (2016). In Situ SXS and XAFS Measurements of Electrochemical Interface. In: Kumar, C. (eds) X-ray and Neutron Techniques for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-48606-1_7

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