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Stability of Frequency Locked Loops

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Frequency Standards and Metrology

Abstract

Passive frequency standards are characterized by the use of a reference resonance to stabilize the frequency of an external probe oscillator. A common configuration is shown in Fig. 1 [1–6]. The probe oscillator generally has phase modulation imposed on the carrier in order to interrogate the resonance with a minimum of offset. The resulting amplitude modulation is demodulated to yield an error curve that is essentially the derivative of the resonance. Although Fig. 1 shows a transmission system, similar schemes are sometimes possible in reflection [5]. The error signal from the demodulator is used to steer the probe signal toward the center of the resonance line [1–9]. For analysis times longer than one period of the modulation cycle, and under the condition that the probe oscillator wanders less than the half width of the error curve in the loop attack time, we can treat this curve as approximately static[1–4]. Near line center the loop error voltage VD at the synchronous detector, is approximately VD = k (v oo - vR) + Vn where k is the slope of the error curve, vR is the resonance frequency of the reference, and v oo is the open loop frequency of the probe oscillator and Vn is the detector noise. If we now close the loop with gain G(f), it can be shown that the spectral density of fractional frequency fluctuations Sy(f) for the probe source becomes where Sy o(f) is the open-loop spectral density of fractional frequency fluctuations of the probe source, SyR(f) is that of the reference, and SyN(f) is that of the detector and interrogation noise referred to the demodulator output.

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© 1989 Springer-Verlag Berlin, Heidelberg

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Walls, F.L. (1989). Stability of Frequency Locked Loops. In: De Marchi, A. (eds) Frequency Standards and Metrology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-74501-0_27

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  • DOI: https://doi.org/10.1007/978-3-642-74501-0_27

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-74503-4

  • Online ISBN: 978-3-642-74501-0

  • eBook Packages: Springer Book Archive

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