Abstract
After discussing the design principles of soft X-ray interferometers, we present in some details the implementation and recent results of an experiment currently developed at Orsay, to measure the dispersion of the carbon refractive index, near the K-edge. A particular stress will be given to the moiré-based detection system, which provides a quick, nearly “real-time“ measurement of the sample optical thickness.
More generally, as interferometric techniques provide access to the optical phase of X-ray wavefronts, they should bring a powerful new toolbox for doing physics with soft X-rays. A short overview on some interferometric experiments, in preparation or already attempted, will be given.
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© 1998 Springer-Verlag Berlin Heidelberg
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Joyeux, D., Polack, F. (1998). Carbon Index Measurement Near K Edge, by Interferometry with Optoelectronic Detection. In: Thieme, J., Schmahl, G., Rudolph, D., Umbach, E. (eds) X-Ray Microscopy and Spectromicroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72106-9_22
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DOI: https://doi.org/10.1007/978-3-642-72106-9_22
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