Abstract
This chapter describes relevant methods of micro- and nanosurface chemical analysis used in technical diagnostics. Informative case studies in diagnostics applied in a wide range of industrial technology are presented, too.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Heinrich, K.V.J.: Electron beam x-ray microanalysis. Van Nostrand-Reinhold, New York (1981)
Briggs, D., Grant, J.T. (eds.): Surface Analysis. IM Publications, UK (2003). ISBN 1-901019-04-7
Unger, W.E.S.: Surface analysis: auger electron spectroscopy. In: Worsfold, P.J. (ed.) The Encyclopedia of Analytical Science, 2nd edn., pp. 466–474. Alan Townsend and Colin F. Poole, Elsevier (2005). ISBN: 978-0-12-369397-6
Briggs, D., Seah, M.P. (eds.): Practical surface analysis. In: Ion and Neutral Spectroscopy, vol 2, Wiley, Chichester (1992). ISBN 0-471-92082-7
Riviere, J.C., Myhra, S. (eds.): Handbook of Surface and Interface Analysis—Methods for Problem-Solving, 2nd edn. CRC Press Tayler & Francis Group. Boca Raton (2009). ISBN 978-0-8493-7558-3
Business Plans of ISO/TC 201 “Surface chemical analysis” and ISO/TC202 “Microbeam Analysis”, www.iso.org
Seah, M.P., Dench, W.A.: Quantitative electron spectroscopy of surfaces: a standard data base for electron inelastic mean free paths in solids. Surf. Interface Anal. 1, 2 (1979)
Jenkins, R., Manne, R., Robin, R., Senemaud, C.: Nomenclature system for x-ray spectroscopy. Pure Appl. Chem. 63(5), 735–746 (1991)
Ritchie, N.W.M., Davis, J., Newbury, D.E.: Energy dispersive spectrometry at wavelength precision. Microsc. Microanal. 17(Suppl 2), 556–557 (2011)
Newbury, D.E., Swyt, C.R., Myklebust, R.L.: “Standardless” quantitative electron probe microanalysis with energy-dispersive x-ray spectrometry: is it worth the risk? Anal. Chem. 67, 1866–1871 (1995)
Alvisi, M., Blome, M., Griepentrog, M., Hodoroaba, V.-D., Karduck, P., Mostert, M., Nacucchi, M., Procop, M., Rohde, M., Scholze, F., Statham, P., Terborg, R., Thiot, J.F.: The determination of the efficiency of energy dispersive X-ray spectrometers by a new reference material. Microsc. Microanal. 12(5), 406–415 (2006)
Bailly, A., Renault, O., Barrett, N., Desrues, T., Mariolle, D., Zagonel, L.F., Escher, M.: Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy. J. Phys. Condens. Matter 21, 314002 (2009). doi:10.1088/0953-8984/21/31/314002
Yu, B.-Y., Chen, Y.-Y., Wang, W.-B., et al.: Depth profiling of organic films with x-ray photoelectron spectroscopy using C(60)(+) and Ar(+) co-sputtering. Anal. Chem., 80, 3412–3415 (2008).doi: 10.1021/ac702626n
Ninomiya, S., Ichiki, K., Yamada, H., et al.: Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Rapid Commun. Mass Spectrom. 23, 1601–1606 (2009). doi: 10.1002/rcm.4046
Rabbani, S., Barber, A.M., Fletcher, J.S., et al.: TOF-SIMS with Argon gas cluster ion beams: a comparison with C(60)(+). Anal. Chem. 83, 3793–3800 (2011). doi: 10.1021/ac200288v
Gross, T., Treu, D., Unger, W.: Standard operating procedure (SOP) for the quantitative determination of organic silicon compounds at the surface of elastomeric sealants. Appl. Surf. Sci. 179, 109–112 (2001)
Oran, U., Ünveren, E., Wirth, T., Unger, W.E.S.: Polydimethylsiloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results. Appl. Surf. Sci. 227, 318–324 (2004)
Min, H., Girard-Lauriault, P.-L., Gross, T., Lippitz, A., Dietrich, P., Unger, W.E.S.: Ambient-ageing processes in amine self-assembled monolayers on microarray slides as studied by ToF-SIMS with principal component analysis, XPS, and NEXAFS spectroscopy. Anal. Bioanal. Chem. 403(2), 613–623 (2012). doi:10.1007/s00216-012-5862-5
zu Köcker, G.M., Gross, T., Santner, E.: Influence of the testing parameters on the tribological behavior of self-mated PVD-coatings. Wear 179, 5–10 (1994)
Shimizu, K., Habazaki, H., Skeldon, P., Thompson, G.E.: Radiofrequency GDOES: a powerful technique for depth profiling analysis of thin films. Surf. Interface Anal. 35, 564–574 (2003). doi:10.1002/sia.1572
Hinze, A., Klages, C.P., Zänker, A., Thomas, M., Wirth, T., Unger, W.E.S.: ToF-SIMS imaging of DBD-plasma-printed microspots on BOPP substrates, Plasma Processes Polym. 5 460–470 (2008). doi: 10.1002/ppap.200700138
Straub, F., Wirth, T., Hertwig, A., Hodoroaba, V.-D., Unger, W.E.S., Böllinghaus, T.: Imaging the microstructure of duplex stainless steel samples with TOF-SIMS. Surf. Interface Anal. 42, 739–742 (2010). doi:10.1002/sia.3385
Acknowledgments
The authors gratefully acknowledge discussions and case study contributions by Dipl.-Ing. F. Straub, Dr. H. Min, Dr. T. Gross and Dipl.-Phys. T. Wirth (all BAM).
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Unger, W.E.S., Hodoroaba, VD. (2013). Surface Chemical Analysis at the Micro- and NanoScale. In: Czichos, H. (eds) Handbook of Technical Diagnostics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25850-3_15
Download citation
DOI: https://doi.org/10.1007/978-3-642-25850-3_15
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-25849-7
Online ISBN: 978-3-642-25850-3
eBook Packages: EngineeringEngineering (R0)