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Surface Chemical Analysis at the Micro- and NanoScale

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Handbook of Technical Diagnostics

Abstract

This chapter describes relevant methods of micro- and nanosurface chemical analysis used in technical diagnostics. Informative case studies in diagnostics applied in a wide range of industrial technology are presented, too.

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References

  1. Heinrich, K.V.J.: Electron beam x-ray microanalysis. Van Nostrand-Reinhold, New York (1981)

    Google Scholar 

  2. Briggs, D., Grant, J.T. (eds.): Surface Analysis. IM Publications, UK (2003). ISBN 1-901019-04-7

    Google Scholar 

  3. Unger, W.E.S.: Surface analysis: auger electron spectroscopy. In: Worsfold, P.J. (ed.) The Encyclopedia of Analytical Science, 2nd edn., pp. 466–474. Alan Townsend and Colin F. Poole, Elsevier (2005). ISBN: 978-0-12-369397-6

    Google Scholar 

  4. Briggs, D., Seah, M.P. (eds.): Practical surface analysis. In: Ion and Neutral Spectroscopy, vol 2, Wiley, Chichester (1992). ISBN 0-471-92082-7

    Google Scholar 

  5. Riviere, J.C., Myhra, S. (eds.): Handbook of Surface and Interface Analysis—Methods for Problem-Solving, 2nd edn. CRC Press Tayler & Francis Group. Boca Raton (2009). ISBN 978-0-8493-7558-3

    Google Scholar 

  6. Business Plans of ISO/TC 201 “Surface chemical analysis” and ISO/TC202 “Microbeam Analysis”, www.iso.org

  7. Seah, M.P., Dench, W.A.: Quantitative electron spectroscopy of surfaces: a standard data base for electron inelastic mean free paths in solids. Surf. Interface Anal. 1, 2 (1979)

    Article  Google Scholar 

  8. Jenkins, R., Manne, R., Robin, R., Senemaud, C.: Nomenclature system for x-ray spectroscopy. Pure Appl. Chem. 63(5), 735–746 (1991)

    Article  Google Scholar 

  9. Ritchie, N.W.M., Davis, J., Newbury, D.E.: Energy dispersive spectrometry at wavelength precision. Microsc. Microanal. 17(Suppl 2), 556–557 (2011)

    Article  Google Scholar 

  10. Newbury, D.E., Swyt, C.R., Myklebust, R.L.: “Standardless” quantitative electron probe microanalysis with energy-dispersive x-ray spectrometry: is it worth the risk? Anal. Chem. 67, 1866–1871 (1995)

    Article  Google Scholar 

  11. Alvisi, M., Blome, M., Griepentrog, M., Hodoroaba, V.-D., Karduck, P., Mostert, M., Nacucchi, M., Procop, M., Rohde, M., Scholze, F., Statham, P., Terborg, R., Thiot, J.F.: The determination of the efficiency of energy dispersive X-ray spectrometers by a new reference material. Microsc. Microanal. 12(5), 406–415 (2006)

    Article  Google Scholar 

  12. Bailly, A., Renault, O., Barrett, N., Desrues, T., Mariolle, D., Zagonel, L.F., Escher, M.: Aspects of lateral resolution in energy-filtered core level photoelectron emission microscopy. J. Phys. Condens. Matter 21, 314002 (2009). doi:10.1088/0953-8984/21/31/314002

  13. Yu, B.-Y., Chen, Y.-Y., Wang, W.-B., et al.: Depth profiling of organic films with x-ray photoelectron spectroscopy using C(60)(+) and Ar(+) co-sputtering. Anal. Chem., 80, 3412–3415 (2008).doi: 10.1021/ac702626n

    Google Scholar 

  14. Ninomiya, S., Ichiki, K., Yamada, H., et al.: Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Rapid Commun. Mass Spectrom. 23, 1601–1606 (2009). doi: 10.1002/rcm.4046

  15. Rabbani, S., Barber, A.M., Fletcher, J.S., et al.: TOF-SIMS with Argon gas cluster ion beams: a comparison with C(60)(+). Anal. Chem. 83, 3793–3800 (2011). doi: 10.1021/ac200288v

    Google Scholar 

  16. Gross, T., Treu, D., Unger, W.: Standard operating procedure (SOP) for the quantitative determination of organic silicon compounds at the surface of elastomeric sealants. Appl. Surf. Sci. 179, 109–112 (2001)

    Article  Google Scholar 

  17. Oran, U., Ünveren, E., Wirth, T., Unger, W.E.S.: Polydimethylsiloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results. Appl. Surf. Sci. 227, 318–324 (2004)

    Article  Google Scholar 

  18. Min, H., Girard-Lauriault, P.-L., Gross, T., Lippitz, A., Dietrich, P., Unger, W.E.S.: Ambient-ageing processes in amine self-assembled monolayers on microarray slides as studied by ToF-SIMS with principal component analysis, XPS, and NEXAFS spectroscopy. Anal. Bioanal. Chem. 403(2), 613–623 (2012). doi:10.1007/s00216-012-5862-5

  19. zu Köcker, G.M., Gross, T., Santner, E.: Influence of the testing parameters on the tribological behavior of self-mated PVD-coatings. Wear 179, 5–10 (1994)

    Google Scholar 

  20. Shimizu, K., Habazaki, H., Skeldon, P., Thompson, G.E.: Radiofrequency GDOES: a powerful technique for depth profiling analysis of thin films. Surf. Interface Anal. 35, 564–574 (2003). doi:10.1002/sia.1572

    Article  Google Scholar 

  21. Hinze, A., Klages, C.P., Zänker, A., Thomas, M., Wirth, T., Unger, W.E.S.: ToF-SIMS imaging of DBD-plasma-printed microspots on BOPP substrates, Plasma Processes Polym. 5 460–470 (2008). doi: 10.1002/ppap.200700138

  22. Straub, F., Wirth, T., Hertwig, A., Hodoroaba, V.-D., Unger, W.E.S., Böllinghaus, T.: Imaging the microstructure of duplex stainless steel samples with TOF-SIMS. Surf. Interface Anal. 42, 739–742 (2010). doi:10.1002/sia.3385

    Article  Google Scholar 

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Acknowledgments

The authors gratefully acknowledge discussions and case study contributions by Dipl.-Ing. F. Straub, Dr. H. Min, Dr. T. Gross and Dipl.-Phys. T. Wirth (all BAM).

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Correspondence to Wolfgang E. S. Unger .

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Unger, W.E.S., Hodoroaba, VD. (2013). Surface Chemical Analysis at the Micro- and NanoScale. In: Czichos, H. (eds) Handbook of Technical Diagnostics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-25850-3_15

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  • DOI: https://doi.org/10.1007/978-3-642-25850-3_15

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