Abstract
This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III–V semiconductor nanostructures and heterostructures.
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References
M. De Graef, Introduction to Conventional Transmission Electron Microscopy (Cambridge University Press, Cambridge, 2003)
D.B. Williams, C.B. Carter, Transmission Electron Microscopy: A Textbook for Materials Science (Springer, New York, 2009)
S.J. Pennycook et al., in The Oxford Handbook of Nanoscience and Technology: Frontiers and Advances: in Three Volumes, ed. by A.V. Narlikar, Y.Y. Fu (Oxford University Press, New York, 2010), Volume II: Materials
S.J. Pennycook, M. Varela, C.J.D. Hetherington, A.I. Kirkland, MRS Bull. 31, 36 (2006)
M. Varela, A.R. Lupini, K.V. Benthem, A.Y. Borisevich, M.F. Chisholm, N. Shibata, E. Abe, S.J. Pennycook, Annu. Rev. Mater. Res. 35, 539 (2005)
S.J. Pennycook, S.D. Berger, R.J. Culbertson, J. Microsc. Oxford 144, 229 (1986)
A. Howie, J. Microsc. Oxford 117, 11 (1979)
P.D. Nellist, S.J. Pennycook, J. Microsc. 190, 159 (1998)
S.J. Pennycook, D.E. Jesson, Phys. Rev. Lett. 64, 938 (1990)
P.D. Nellist, et al., Science 305, 1741 (2004)
M. Galluppi, A. Frova, M. Capizzi, F. Boscherini, P. Frigeri, S. Franchi, A. Passaseo, Appl. Phys. Lett. 78, 3121 (2001)
J. Shumway, A.J. Williamson, A. Zunger, A. Passaseo, M. DeGiorgi, R. Cingolani, M. Catalano, P. Crozier, Phys. Rev. B 64, 125302 (2001)
H. E, P.D. Nellist, S. Lozano-Perez, D. Ozkaya, J. Phys. Conf. Ser. 241, 012067 (2010)
L.J. Allen, A.J. D’Alfonso, S.D. Findlay, J.M. LeBeau, N.R. Lugg, S. Stemmer, J. Phys. Conf. Ser. 241, 012061 (2010)
E. Carlino, S. Modesti, D. Furlanetto, M. Piccin, S. Rubini, A. Franciosi, Appl. Phys. Rev. 83, 662 (2003) doi:10.1063/1.1592314
D. Zhi, P.A. Midgley, R.E. Dunin-Borkowski, B.A. Joyce, D.W. Pashley, A.L. Bleloch, P.J. Goodhew, in Group-IV Semiconductor Nanostructures, vol. 832, ed. by L. Tsybeskov, D.J. Lockwood, C. Delerue, M. Ichikawa (2005), p. 105
S.I. Molina, D.L. Sales, P.L. Galindo, D. Fuster, Y. Gonzalez, B. Alen, L. Gonzalez, M. Varela, S.J. Pennycook, Ultramicroscopy 109, 1315 (2009)
R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986)
P.L. Galindo, S. Kret, A.M. Sanchez, J.Y. Laval, A. Yanez, J. Pizarro, E. Guerrero, T. Ben, S.I. Molina, Ultramicroscopy 107, 1186 (2007)
J.M. LeBeau, S.D. Findlay, L.J. Allen, S. Stemmer, Phys. Rev. Lett. 100, 206101 (2008)
J.M. LeBeau, S. Stemmer, Ultramicroscopy 108, 1653 (2008)
S.I. Molina, M.P. Guerrero, P.L. Galindo, D.L. Sales, M. Varela, S.J. Pennycook, J. Electron Microsc. 60, 29 (2011)
M. Takeda, H. Ina, S. Kobayashi, J. Opt. Soc. Am. 72, 156 (1982)
R. Bierwolf, M. Hohenstein, F. Phillipp, O. Brandt, G.E. Crook, K. Ploog, Ultramicroscopy 49, 273 (1993)
P.H. Jouneau, A. Tardot, G. Feuillet, H. Mariette, J. Cibert, J. Appl. Phys. 75, 7310 (1994)
H. Seitz, M. Seibt, F.H. Baumann, K. Ahlborn, W. Schroter, Phys. Stat. Sol. A Appl. Res. 150, 625 (1995)
R. Kilaas, S. Paciornik, A.J. Schwartz, L.E. Tanner, J. Comput. Assist. Microsc. 6, 129 (1994)
M.D. Robertson, J.M. Corbett, J.B. Webb, J. Jagger, J.E. Currie, Micron 26, 521 (1995)
A. Rosenauer, S. Kaiser, T. Reisinger, J. Zweck, W. Gebhardt, D. Gerthsen, Optik 102, 63 (1996)
S. Kret, P. Ruterana, A. Rosenauer, D. Gerthsen, Phys. Stat. Sol. B Basic Res. 227, 247 (2001)
M.J. Hÿtch, E. Snoeck, R. Kilaas, Ultramicroscopy 74, 131 (1998)
D.J. Bone, H.A. Bachor, R.J. Sandeman, Appl. Opt. 25, 1653 (1986)
M. Takeda, J. Suzuki, J. Opt. Soc. Am. A Opt. Image Sci. Vis. 13, 1495 (1996)
M.J. Hytch, J.L. Putaux, J.M. Penisson, Nature 423, 270 (2003)
A.M. Sanchez, P.L. Galindo, S. Kret, M. Falke, R. Beanland, P.J. Goodhew, Microsc. Microanal. 12, 285 (2006)
E. Guerrero, P. Galindo, A. Yanez, T. Ben, S.I. Molina, Microsc. Microanal. 13, 320 (2007)
K. Tillmann, M. Lentzen, R. Rosenfeld, Ultramicroscopy 83, 111 (2000)
M.J. Hytch, T. Plamann, Ultramicroscopy 87, 199 (2001)
M.M.J. Treacy, J.M. Gibson, J. Vac. Sci. Tech. B 4, 1458 (1986)
S. Shusterman, A. Raizman, A. Sher, A. Schwarzman, O. Azriel, A. Boag, Y. Rosenwaks, P.L. Galindo, Y. Paltiel, EPL 88 (2009)
A. Kovacs, K. Sato, V.K. Lazarov, P.L. Galindo, T.J. Konno, Y. Hirotsu, Phys. Rev. Lett. 103 (2009)
P.D. Robb, A.J. Craven, Ultramicroscopy 109, 61 (2008)
K. Tomioka, J. Motohisa, S. Hara, T. Fukui, Nano Lett. 8, 3475 (2008)
F.M. Morales, D. Gonzalez, J.G. Lozano, R. Garcia, S. Hauguth-Frank, V. Lebedev, V. Cimalla, O. Ambacher, Acta Mater. 57, 5681 (2009)
J.H. Chung, G.D. Lian, L. Rabenberg, IEEE Electron Dev. Lett. 31, 854 (2010)
F. Hue, M. Hytch, F. Houdellier, E. Snoeck, A. Claverie, Mater. Sci. Eng. B Adv. Funct. Solid State Mater. 154, 221 (2008)
F. Hue, M. Hytch, H. Bender, F. Houdellier, A. Claverie, Phys. Rev. Lett. 100, 156602 (2008)
HREM Research, http://www.hremresearch.com/Eng/plugin/PPAEng.html
M. Henini, M. Bugajski, Microelectron. J. 36, 950 (2005)
H.Y. Liu, M.J. Steer, T.J. Badcock, D.J. Mowbray, M.S. Skolnick, P. Navaretti, K.M. Groom, M. Hopkinson, R.A. Hogg, Appl. Phys. Lett. 86 (2005)
M. Yano, M. Ashida, Y. Iwai, M. Inoue, Appl. Surf. Sci. 41–42, 457 (1989)
S.I. Molina et al., Appl. Phys. Lett. 91 (2007)
A.M. Sanchez et al., Nanotechnology 21 (2010)
S.I. Molina, A.M. Beltran, T. Ben, P.L. Galindo, E. Guerrero, A.G. Taboada, J.M. Ripalda, M.F. Chisholm, Appl. Phys. Lett. 94 (2009)
J.M. Garcia, L. Gonzalez, M.U. Gonzalez, J.P. Silveira, Y. Gonzalez, F. Briones, J. Cryst. Growth 227, 975 (2001)
L. Gonzalez, J.M. Garcia, R. Garcia, F. Briones, J. Martinez-Pastor, C. Ballesteros, Appl. Phys. Lett. 76, 1104 (2000)
D. Fuster, L. Gonzalez, Y. Gonzalez, M.U. Gonzalez, J. Martinez-Pastor, J. Appl. Phys. 98 (2005)
D. Fuster, B. Alen, L. Gonzalez, Y. Gonzalez, J. Martinez-Pastor, M.U. Gonzalez, J.M. Garcia, Nanotechnology 18 (2007)
D. Fuster, L. Gonzalez, Y. Gonzalez, J. Martinez-Pastor, T. Ben, A. Ponce, S. Molina, Eur. Phys. J. B 40, 433 (2004)
D. Fuster, M.U. Gonzalez, L. Gonzalez, Y. Gonzalez, T. Ben, A. Ponce, S.I. Molina, Appl. Phys. Lett. 84, 4723 (2004)
M.S. Skolnick, D.J. Mowbray, Annu. Rev. Mater. Res. 34, 181 (2004)
D.L. Sales, M. Varela, S.J. Pennycook, P.L. Galindo, L. Gonzalez, Y. Gonzalez, D. Fuster, S.I. Molina, Nanotechnology 1, 325706 (2010)
G.R. Liu, S.S.Q. Jerry, Semicond. Sci. Tech. 17, 630 (2002)
P. Liu, Y.W. Zhang, C. Lu, Phys. Rev. B 68, 195314 (2003)
Q.X. Pei, C. Lu, Y.Y. Wang, J. Appl. Phys. 93, 1487 (2003)
Y.W. Zhang, S.J. Xu, C.H. Chiu, Appl. Phys. Lett. 74, 1809 (1999)
S.I. Molina et al., J. Nanosci. Nanotechnol. 8, 3422 (2008)
S.I. Molina et al., Nanotechnology 17, 5652 (2006)
T. Ben et al., Microsc. Microanal. 14, 344 (2008)
M. Kondow, K. Uomi, A. Niwa, T. Kitatani, S. Watahiki, Y. Yazawa, Jpn. J. Appl. Phys. 1 Regular Papers Short Notes Rev. Papers 35, 1273 (1996)
S. Dhar, N. Halder, A. Mondal, Thin Solid Films 515, 4427 (2007)
W.M. Chen, I.A. Buyanova, C.W. Tu, H. Yonezu, Acta Phys. Pol. A 108, 571 (2005)
R. Intartaglia et al., IEE Proc. Optoelectron. 151, 365 (2004)
M. Herrera et al., Phys. Rev. B 80, 125211 (2009)
D.D. Perovic, C.J. Rossouw, A. Howie, Ultramicroscopy 52, 353 (1993)
M.M.J. Treacy, J.M. Gibson, K.T. Short, S.B. Rice, Ultramicroscopy 26, 133 (1988)
V. Grillo, E. Carlino, F. Glas, Phys. Rev. B 77 054103 (2008)
X. Wu, M.D. Robertson, J.A. Gupta, J.M. Baribeau, J. Phys. Condens. Matter 20, 075215 (2008)
S.B. Zhang, A. Zunger, Appl. Phys. Lett. 71, 677 (1997)
P. Krispin, V. Gambin, J.S. Harris, K.H. Ploog, J. Appl. Phys. 93, 6095 (2003)
M. Reason, H.A. McKay, W. Ye, S. Hanson, R.S. Goldman, V. Rotberg, Appl. Phys. Lett. 85, 1692 (2004)
I.H. Ho, G.B. Stringfellow, J. Cryst. Growth 178, 1 (1997)
P.R. Chalker, T.J. Bullough, M. Gass, S. Thomas, T.B. Joyce, J. Phys. Condens. Matter 16, S3161 (2004)
G. Kresse, J. Furthmuller, Phys. Rev. B 54, 11169 (1996)
J. Pizarro, P.L. Galindo, E. Guerrero, A. Yanez, M.P. Guerrero, A. Rosenauer, D.L. Sales, S.I. Molina, Appl. Phys. Lett. 93, 153107 (2008)
D.O. Klenov, S. Stemmer, Ultramicroscopy 106, 889 (2006)
R.A. Herring, Ultramicroscopy 106, 960 (2006)
C.R. Hall, P.B. Hirsch, G.R. Booker, Phil. Mag. 14, 979 (1966)
A. Carvalho et al., Phys. B Condens. Matter 401, 339 (2007)
T. Matsuoka, H. Okamoto, M. Nakao, H. Harima, E. Kurimoto, Appl. Phys. Lett. 81, 1246 (2002)
J. Wu, W. Walukiewicz, K.M. Yu, J.W. Ager, E.E. Haller, H. Lu, W.J. Schaff, Y. Saito, Y. Nanishi, Appl. Phys. Lett. 80, 3967 (2002)
M. Hori, K. Kano, T. Yamaguchi, Y. Saito, T. Araki, Y. Nanishi, N. Teraguchi, A. Suzuki, Phys. Stat. Sol. (B) 234, 750 (2002)
V.Y. Davydov et al., Phys. Stat. Sol. (B) 230, R4 (2002)
T.L. Tansley, C.P. Foley, J. Appl. Phys. 59, 3241 (1986)
A.G. Bhuiyan, A. Hashimoto, A. Yamamoto, J. Appl. Phys. 94, 2779 (2003)
N. Khan, A. Sedhain, J. Li, J.Y. Lin, H.X. Jiang, Appl. Phys. Lett. 92, 172101 (2008)
T.B. Fehlberg, G.A. Umana-Membreno, C.S. Gallinat, G. Koblmüller, S. Bernardis, B.D. Nener, G. Parish, J.S. Speck, Phys. Stat. Sol. (C) 4, 2423 (2007)
O. Briot, B. Maleyre, S. Ruffenach, Appl. Phys. Lett. 83, 2919 (2003)
S. Ruffenach, B. Maleyre, O. Briot, B. Gil, Phys. Stat. Sol. (C) 2, 826 (2005)
Y.G. Cao, M.H. Xie, Y. Liu, Y.F. Ng, H.S. Wu, S.Y. Tong, Appl. Phys. Lett. 83, 5157 (2003)
E. Dimakis et al., Phys. Stat. Sol. (C) 3, 3983 (2006)
S. Ruffenach, O. Briot, M. Moret, B. Gil, Appl. Phys. Lett. 90, 153102 (2007)
C. Shen, H. Lin, H. Lee, C. Wu, J. Hsu, S. Gwo, Thin Solid Films 494, 79 (2006)
M. Kumar, B. Roul, T.N. Bhat, M.K. Rajpalke, N. Sinha, A.T. Kalghatgi, S.B. Krupanidhi, Adv. Sci. Lett. 3, 379 (2010)
Y. Romanyuk, R. Dengel, L. Stebounova, S. Leone, J. Cryst. Growth 304, 346 (2007)
J.Y. Chen et al., Appl. Phys. Lett. 92, 162103 (2008)
A. Yoshikawa, N. Hashimoto, N. Kikukawa, S.B. Che, Y. Ishitani, Appl. Phys. Lett. 86, 153115 (2005)
C.Y. Chen, L. Lee, S.K. Tai, S.F. Fu, W.C. Ke, W.C. Chou, W.H. Chang, M.C. Lee, W.K. Chen, Jpn. J. Appl. Phys. 48, 031001 (2009)
S. Yuanping, W. Hui, W. Lili, Z. Shuming, Y. Hui, C. Yong-Hoon, J. Kor. Phys. Soc. 57, 128 (2010)
Y.K. Huang, C.P. Liu, Y.L. Lai, C.Y. Wang, Y.F. Lai, H.C. Chung, Appl. Phys. Lett. 91, 091921 (2007)
S.B. Che, W. Terashima, T. Ohkubo, M. Yoshitani, N. Hashimoto, K. Akasaka, Y. Ishitani, A. Yoshikawa, Phys. Stat. Sol. (C) 2, 2258 (2005)
W. Lin, S. Li, J. Kang, Appl. Phys. Lett. 96, 101115 (2010)
A. Yoshikawa, S.B. Che, W. Yamaguchi, H. Saito, X.Q. Wang, Y. Ishitani, E.S. Hwang, Appl. Phys. Lett. 90, 073101 (2007)
H. Naoi, M. Kurouchi, D. Muto, S. Takado, T. Araki, T. Miyajima, H. Na, A.Y. Nanishi, Phys. Stat. Sol. (a) 203, 93 (2006)
S. Che, A. Yuki, H. Watanabe, Y. Ishitani, A. Yoshikawa, Appl. Phys. Expr. 2, 021001 (2009)
E. Calleja, J. Ristić, S. Fernández-Garrido, L. Cerutti, M.A. Sánchez-García, J. Grandal, A. Trampert, U. Jahn, G. Sánchez, A. Griol, B. Sánchez, Growth, morphology, and structural properties of group-III-nitride nanocolumns and nanodisks. Phys. Status Solidi B 244, 2816–2837 (2007)
C. Denker, J. Malindretos, F. Werner, F. Limbach, H. Schuhmann, T. Niermann, M. Seibt, A. Rizzi, Phys. Stat. Sol. C – Curr. Top. Solid State Phys. 5(6), 1706 (2008)
Y.L. Chang, F. Li, Z. Mi, J. Vacuum Science & Technology B 28(3) DOI: 10.1116/1.3292560 (2010)
J. Zhang, B. Xu, F. Jiang, Y. Yang, J. Li, Phys. Lett. A 337, 121 (2005)
Y.H. Kim, H.J. Park, K. Kim, C.S. Kim, W.S. Yun, J.W. Lee, M.D. Kim, Appl. Phys. Lett. 95, 033112 (2009)
S.Y. Kwon et al., Appl. Phys. Lett. 91, 234102 (2007)
J.G. Lozano, D. González, A.M. Sánchez, D. Araújo, S. Ruffenach, O. Briot, R. García, Phys. Stat. Sol. (C) 3, 1687 (2006)
J.G. Lozano, A.M. Sanchez, R. Garcia, D. Gonzalez, O. Briot, S. Ruffenach, Appl. Phys. Lett. 88, 151913 (2006)
A.M. Sánchez, J.G. Lozano, R. García, M. Herrera, S. Ruffenach, O. Briot, D. González, Adv. Funct. Mater. 17, 2588 (2007)
J.G. Lozano, A.M. Sanchez, R. García, D. González, D. Araujo, S. Ruffenach, O. Briot, Appl. Phys. Lett. 87, 263104 (2005)
D. González, J.G. Lozano, M. Herrera, N.D. Browning, S. Ruffenach, O. Briot, R. Garíca, J. Appl. Phys. 105, 013527 (2009)
D. González, J.G. Lozano, M. Herrera, F.M. Morales, S. Ruffenach, O. Briot, R. García, Nanotechnology 21, 185706 (2010)
J.M. Mánuel, F.M. Morales, J.G. Lozano, D. González, R. García, T. Lim, L. Kirste, R. Aidam, O. Ambacher, Acta Mater. 58, 4120 (2010)
J.M. Mánuel, F.M. Morales, R. García, R. Lim, L. Kirste, R. Aidam, O. Ambacher, Cryst. Growth and Design 11, 2588 (2011)
J.M. Mánuel, F.M. Morales, J.G. Lozano R. García, T. Lim L. Kirste, R. Aidam, O. Ambacher, Phys. Stat. Sol. (C) 8(7–8), 2500–2502 (2011)
F.Y. Meng, M. Rao, N. Newman, R. Carpenter, S. Mahajan, Acta Mater. 56, 4036 (2008)
F.Y. Meng, M. Rao, N. Newman, S. Mahajan, Acta Mater. 56, 5552 (2008)
M. Rao, D. Kim, S. Mahajan, Appl. Phys. Lett. 85, 1961 (2004)
M. Rao, N. Newman, S. Mahajan, Scripta Mater. 56, 33 (2007)
A.N. Westmeyer, S. Mahajan, Appl. Phys. Lett. 79, 2710 (2001)
A. Wise, R. Nandivada, B. Strawbridge, R. Carpenter, N. Newman, S. Mahajan, Appl. Phys. Lett. 92, 261914 (2008)
A.T. Wise, D.W. Kim, N. Newman, S. Mahajan, Scripta Mater. 54, 153 (2006)
L. Zhou, D.A. Cullen, D.J. Smith, M.R. McCartney, A. Mouti, M. Gonschorek, E. Feltin, J.F. Carlin, N. Grandjean, Appl. Phys. Lett. 94, 121909 (2009)
N. Li, S.J. Wang, E.H. Park, Z.C. Feng, H.L. Tsai, J.R. Yang, I. Ferguson, J. Cryst. Growth 311, 4628 (2009)
S.L. Sahonta et al., Appl. Phys. Lett. 95, 021913 (2009)
L. Zhou, D.J. Smith, M.R. McCartney, D.S. Katzer, D.F. Storm, Appl. Phys. Lett. 90, 081917 (2007)
T. Kehagias et al., Appl. Phys. Lett. 95, 071905 (2009)
Z.L. Miao et al., Appl. Phys. Lett. 95, 231909 (2009)
M.E. Hawkridge, Z. Liliental-Weber, H.J. Kim, S. Choi, D. Yoo, J.H. Ryou, R.D. Dupuis, Appl. Phys. Lett. 94, 071905 (2009)
M.E. Hawkridge, Z. Liliental-Weber, H.J. Kim, S. Choi, D. Yoo, J.H. Ryou, R.D. Dupuis, Appl. Phys. Lett. 94, 171912 (2009)
J. Park, S.I. Baik, D.S. Ko, S.H. Park, E. Yoon, Y.W. Kim, J. Electron. Mater. 38, 518 (2009)
Z.C. Feng, J.R. Yang, A.G. Li, I.T. Ferguson, in III-Nitride Device and Nano-Engineering, ed. by Z.C. Feng (Imperial College Press, London, 2008)
M. Shiojiri, Chiang Mai J. Sci. 35, 25 (2008)
J. Wu et al., Nanotechnology 17, 1251 (2006)
H. Okuno, M. Takeguchi, K. Mitsuishi, Y. Irokawa, Y. Sakuma, K. Furuya, Surf. Interface Anal. 40, 1660 (2008)
E. Mugnaioli, G. Capitani, F. Nieto, M. Mellini, Am. Mineral. 94, 793 (2009)
C. Williams, T. Glisson, J. Hauser, M. Littlejohn, J. Electron. Mater. 7, 639 (1978)
Acknowledgements
This work was supported by the European Commission (SANDiE European Network of Excellence NMP4-CT-2004-500101 and COST MP0805), the Spanish MICINN (TEC2005-05781-C03-02/MIC, TEC2008-06756-C03-02/TEC, and CONSOLIDER CSD2009-00013), and the Junta de Andalucía (Ref. P08-TEP-03516 and P09-TEP-5403) with EU-FEDER cofinancing. The authors would like to thank their collaborators and other coauthors of the articles reviewed here (A.G. Taboada, A.J. Papworth, A. Yáñez, B. Alén, D. Fuster, D.G. Morgan, F. de la Pena, J.M. Ripalda, L. González, L. Kirste, M.F. Chisholm, M.H. Du, M.H. Gass, M. Hopkinson, M. Varela, M. Walls, N.D. Browning, O. Ambacher, P.J. Goodhew, Q.M. Ramasse, R. Aidam, S.B. Zhang, S. Hauguth-Frank, S.J. Pennycook, T. Lim, V. Cimalla, V. Lebedev, and Y. González).
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Sales, D.L. et al. (2012). High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures. In: Patane, A., Balkan, N. (eds) Semiconductor Research. Springer Series in Materials Science, vol 150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-23351-7_2
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