Skip to main content
Log in

X-ray diffraction investigation of siloxanes. II. Dependence of the structure of cyclic trisiloxanes on the nature of organic substituents at the silicon atom

  • Published:
Journal of Structural Chemistry Aims and scope Submit manuscript

Abstract

The structure of six cyclic trisiloxane compounds with various combinations of carbon and oxygen-containing organic radicals Me, Ph, 2mPh, and 3mPh attached to the silicon atoms and lying in different positions of the trisiloxane cycle has been studied. The Si-O bond lengths vary within wide limits (1.607(5)–1.643(2) Å). Introduction of one or two 2mPh or 3mPh oxygen-containing radicals in the 1,1-position of the trisiloxane ring results in Si-O interatomic distances shortened to 1.624(3) Å. When two 3mPh radicals are in the 1,3-positions, the Si-O bond length decreases to 1.607(5) Å. The calculated charges on the silicon and oxygen atoms of the siloxane ring indicated that there is poor correlation between the charged state of the silicon atom and the Si-O bond length.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. E. Lukevich, O. Pudova, and R. Sturkovich, Molecular Structure of Organosilicons, Ch. 3, Ellis Horwood, Chichester (1989).

    Google Scholar 

  2. W. Clegg, Acta Crystallogr., Sect. B, 38, 1648–1652 (1982).

    Article  Google Scholar 

  3. V. E. Shklover, N. G. Bokii, Yu. T. Struchkov, et al., Zh. Strukt. Khim., 15, 841–849 (1974).

    CAS  Google Scholar 

  4. N. G. Bokii, G. N. Zakharova, and Yu. T. Struchkov, ibid., 13, 291–297 (1972).

    CAS  Google Scholar 

  5. P. E. Tomlins, J. E. Ludon, D. Akrigg, and B. Sheldrik, Acta Crystallogr., Sect. C, 41, 292–298 (1985).

    Article  Google Scholar 

  6. Yu. E. Ovchinnikov, Yu. T. Struchkov, M. I. Buzin, and V. S. Papkov, Vysokomolek. Soedin., Ser. A, 39, 430–437 (1997).

    CAS  Google Scholar 

  7. Yu. E. Ovchinnikov, V. E. Shklover, Yu. T. Struchkov, et al., Metalloorg. Khim., 1, 1126–1135 (1988).

    Google Scholar 

  8. V. E. Shklover, N. G. Bokii, Yu. T. Struchkov, et al., Zh. Strukt. Khim., 15, 90–98 (1974).

    CAS  Google Scholar 

  9. D. Schmidt-Base and U. Kingebeiel, Chem. Ber., 123, 449–453.

  10. G. M. Sheldrick, SHELX-97. Program for the Refinement of Crystal Structures, Univ. Goettingen, Germany (1997).

    Google Scholar 

  11. M. J. Frisch, G. W. Trucks, H. B. Schlegel, et al., GAUSSIAN-98, Revision A. 9, Gaussian, Inc., Pittsburgh, PA (1998).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Additional information

Dedicated to the 65th Anniversary of Professor Raphael Tabacchi

Original Russian Text Copyright © 2006 by S. T. Malinovskii, A. Tesuro Vallina, and H. Stoeckli-Evans

__________

Translated from Zhurnal Strukturnoi Khimii, Vol. 47, No. 6, pp. 1143–1149, November–December, 2006.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Malinovskii, S.T., Tesuro Vallina, A. & Stoeckli-Evans, H. X-ray diffraction investigation of siloxanes. II. Dependence of the structure of cyclic trisiloxanes on the nature of organic substituents at the silicon atom. J Struct Chem 47, 1134–1140 (2006). https://doi.org/10.1007/s10947-006-0436-z

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10947-006-0436-z

Keywords

Navigation