Abstract
Techniques for accurate structure-factor determination with electron diffraction are discussed. Topics covered include: the systematic row method; three- and four-beam nonsystematic cases; zone-axis convergent-beam electron diffraction; the critical voltage and intersecting-Kikuchi-line method; phases and absorption in multiple-beam cases; and thickness fringes. This chapter is also available as HTML from the International Tables Online site hosted by the IUCr.
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© 2006 International Union of Crystallography
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Gjønnes, J. (2006). Accurate structure-factor determination with electron diffraction. In: Prince, E. (eds) International Tables for Crystallography Volume C: Mathematical, physical and chemical tables. International Tables for Crystallography, vol C. Springer, Dordrecht. https://doi.org/10.1107/97809553602060000616
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DOI: https://doi.org/10.1107/97809553602060000616
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-1900-5
Online ISBN: 978-1-4020-5408-2
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