X-ray Scattering from Spintronic Structures

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Abstract

The principles and underlying physics of grazing-incidence X-ray scattering are outlined in the context of application to the study of room temperature spintronic systems. Examples are presented showing the precision and reliability of analysis. The use of diffuse scatter measurements to separate topological roughness from chemical intermixing at interfaces is described. Extension of the physics to soft X-ray reflectivity under both linear and circularly polarized beams is discussed and the link to high-resolution X-ray diffraction of single crystal spintronic structures highlighted.

Keywords

Critical Angle Bragg Peak Reciprocal Space Grazing Incidence Interface Width 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

List of Abbreviations

CCD

Charge-coupled device

DWB approximation

Distorted wave Born approximation

FWHM

Full width at half-height maximum

GIIXD

Grazing-incidence in-plane X-ray diffraction

GISAXS

Grazing-incidence small-angle X-ray scattering

MBE

Molecular beam epitaxy

r.m.s.

Root mean square

RSM

Reciprocal space map

XMCD

X-ray magnetic circular dichroism

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Copyright information

© Springer Science+Business Media Dordrecht 2015

Authors and Affiliations

  1. 1.Department of PhysicsDurham UniversityDurhamUK

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