X-ray Scattering from Spintronic Structures

  • Brian K. TannerEmail author
Reference work entry


The principles and underlying physics of grazing-incidence X-ray scattering are outlined in the context of application to the study of room temperature spintronic systems. Examples are presented showing the precision and reliability of analysis. The use of diffuse scatter measurements to separate topological roughness from chemical intermixing at interfaces is described. Extension of the physics to soft X-ray reflectivity under both linear and circularly polarized beams is discussed and the link to high-resolution X-ray diffraction of single crystal spintronic structures highlighted.


Critical Angle Bragg Peak Reciprocal Space Grazing Incidence Interface Width 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

List of Abbreviations


Charge-coupled device

DWB approximation

Distorted wave Born approximation


Full width at half-height maximum


Grazing-incidence in-plane X-ray diffraction


Grazing-incidence small-angle X-ray scattering


Molecular beam epitaxy


Root mean square


Reciprocal space map


X-ray magnetic circular dichroism


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Copyright information

© Springer Science+Business Media Dordrecht 2016

Authors and Affiliations

  1. 1.Department of PhysicsDurham UniversityDurhamUK

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