Abstract
The principles and underlying physics of grazing-incidence X-ray scattering are outlined in the context of application to the study of room temperature spintronic systems. Examples are presented showing the precision and reliability of analysis. The use of diffuse scatter measurements to separate topological roughness from chemical intermixing at interfaces is described. Extension of the physics to soft X-ray reflectivity under both linear and circularly polarized beams is discussed and the link to high-resolution X-ray diffraction of single crystal spintronic structures highlighted.
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- CCD:
-
Charge-coupled device
- DWB approximation:
-
Distorted wave Born approximation
- FWHM:
-
Full width at half-height maximum
- GIIXD:
-
Grazing-incidence in-plane X-ray diffraction
- GISAXS:
-
Grazing-incidence small-angle X-ray scattering
- MBE:
-
Molecular beam epitaxy
- r.m.s.:
-
Root mean square
- RSM:
-
Reciprocal space map
- XMCD:
-
X-ray magnetic circular dichroism
References
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Tanner, B.K. (2016). X-ray Scattering from Spintronic Structures. In: Xu, Y., Awschalom, D., Nitta, J. (eds) Handbook of Spintronics. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-6892-5_33
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DOI: https://doi.org/10.1007/978-94-007-6892-5_33
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-007-6891-8
Online ISBN: 978-94-007-6892-5
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