Skip to main content

Plasma Etching

  • Living reference work entry
  • First Online:
Encyclopedia of Microfluidics and Nanofluidics

Synonyms

Advanced Si Etching (ASE); DRIE; High aspect ratio Si etching; ICP etching; Plasma etching

Definition

The plasma etching is the removal process of materials performed by plasma, which is involved in the physical, chemical, and mixed etching mechanisms. The ion-enhanced chemical etching, i.e., reactive radical-dominated etching process with ion assistance is used in microelectronics and MEMS fabrication. The ICP (inductively coupled plasma) etching is considered as the etching process using a high-density plasma generated by the inductive coupling of RF power through an antenna, which is widely used in Si micromachining for high aspect ratio, through Si and deep microstructure fabrication. DRIE(deep reactive ion etching) is another term for ICP etching due to the deep or high aspect ratio microstructure fabricated by RIE principles, which is also called high aspect ratio Si etching or Advanced Silicon Etching (ASE TM, trademark of this technology by STS company which was...

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Institutional subscriptions

References

  1. Oehrlein GS (1990) Chap. 8 Reactive ion etching. In: Rossnagel SM, Cuomo JJ, Westwood WD (eds) Handbook of plasma processing technology. Noyes Publications, Park Ridge, pp 196–231

    Google Scholar 

  2. Grill A (1994) Chap. 8 Plasma assisted etching. In: Cold plasma materials fabrication: from fundamentals to applications. Wiley-IEEE Press, Piscataway, pp 216–245

    Chapter  Google Scholar 

  3. Madou M (2002) Chap. 2 Pattern transfer with dry etching techniques. In: Fundamentals of microfabrication, 2nd edn. CRC Press, Boca Raton, pp 77–121

    Google Scholar 

  4. Kassing R, Rangelow IW (1996) Etching process for high aspect ratio micro systems technology (HARMST). Microsyst Technol 3:20–27

    Article  Google Scholar 

  5. Laermer F, Schilp A (1994) Method of anisotropically etching silicon. German Patent: DE4241045, (USA Patents: 5501893, 1996)

    Google Scholar 

  6. STS Innovations news, issues 1–3, April, July and September, 2006, http://www.stsystems.com/; http://www.spts.com/products/plasma-etch/si-drie

  7. Chung CK, Lu HC, Jaw TH (2000) High aspect ratio silicon trench fabrication by inductively coupled plasma. Microsyst Technol 6:106–108

    Article  Google Scholar 

  8. Chung CK (2004) Geometrical pattern effect on silicon deep etching by an inductively coupled plasma system. J Micromech Microeng 14:656–662

    Article  Google Scholar 

  9. Jansen H, de Boer M, Wiegerink R, Tas N, Smulders E, Neagu C, Elwenspoek M (1997) RIE lag in high aspect ratio trench etching of silicon. Microelectron Eng 35:45–50

    Article  Google Scholar 

  10. Milanovic V (2004) Multilevel beam SOI-MEMS fabrication and applications. J Microelectromech Syst 13(1):19–30

    Article  Google Scholar 

  11. Docker PT, Kinnell PK, Ward MCL (2004) Development of the one-step DRIE dry process for unconstrained fabrication of releASEd MEMS devices. J Micromech Microeng 14:941–944

    Article  Google Scholar 

  12. Mita Y, Kubota M, Harada T, Marty F, Saadany B, Bourouina T, Shibata T (2006) Contour lithography methods for DRIE fabrication of nanometre–millimetre-scale coexisting microsystems. J Micromech Microeng 16:S135–S141

    Article  Google Scholar 

  13. Marty F, Rousseau L, Saadany B, Mercier B, Français O, Mita Y, Bourouina T (2005) Advanced etching of silicon based on deep reactive ion etching for silicon high aspect ratio microstructures and three-dimensional micro- and nanostructures. Microelectron J 36:673–677

    Article  Google Scholar 

  14. Zellner P, Renaghan L, Hasnain Z, Agah M (2010) Fabrication and electrical characterization of high aspect ratio poly-silicon filled through-silicon vias. J Micromech Microeng 20:045013

    Article  Google Scholar 

  15. Dixit P, Vehmas T, Vahanen S, Monnoyer P, Henttinen K (2012) Fabrication and electrical characterization of high aspect ratio poly-silicon filled through-silicon vias. J Micromech Microeng 22:055021

    Article  Google Scholar 

  16. http://www2.dupont.com/WLP/en_US/uses_apps/TSV_3D/tsv.html

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Chen-Kuei Chung .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2014 Springer Science+Business Media New York

About this entry

Cite this entry

Chung, CK. (2014). Plasma Etching. In: Li, D. (eds) Encyclopedia of Microfluidics and Nanofluidics. Springer, Boston, MA. https://doi.org/10.1007/978-3-642-27758-0_1251-5

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-27758-0_1251-5

  • Received:

  • Accepted:

  • Published:

  • Publisher Name: Springer, Boston, MA

  • Online ISBN: 978-3-642-27758-0

  • eBook Packages: Springer Reference EngineeringReference Module Computer Science and Engineering

Publish with us

Policies and ethics