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References
Azzam RMA, Bashara NM (1977) Ellipsometry and polarized light. North Holland Physics, Amsterdam
Haitjema H, Woerlee GF (1989) Analysis of tin dioxide coatings by multiple angle of incidence ellipsometry. Thin Solid Films 169(1):1–16
Heavens OS (1991) Optical properties of thin solid films, 2nd edn. Dover, New York
Jackson JD (1998) Classical electrodynamics, 3rd edn. Wiley, New York
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Haitjema, H. (2014). Ellipsometry. In: Laperrière, L., Reinhart, G. (eds) CIRP Encyclopedia of Production Engineering. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20617-7_16705
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DOI: https://doi.org/10.1007/978-3-642-20617-7_16705
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