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Nanoscopic Architecture and Microstructure

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Springer Handbook of Materials Measurement Methods

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Abstract

The methods compiled in this chapter are important in many areas of materials science and technology because various physical properties of materials (mechanical, thermal, electronic, optical, magnetic, dielectric, biological) depend on their geometric architecture, on scales ranging from the atomic or nanoscopic to the semimicroscopic. Some of the properties are governed only by an elementary atomic group in the structural hierarchy while others are brought about by cooperative functioning of multiple phases or microscopic structures in different dimensions. Corresponding to the vast variety of materials and their properties, a wide range of experimental techniques are available, so that the choice of which technique to employ on starting a study may not be clear. In this respect one should also bear in mind that some of the techniques presented in this chapter are based on physical principles, which are also relevant to the measurement methods compiled in Chapts. 4 and 6.

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Abbreviations

AES:

Auger electron spectroscopy

AFM:

atomic force microscopy

CE:

capillary electrophoresis

CE:

counter electrode

CL:

cathodoluminescence

CT:

compact tension

DLTS:

deep level transient spectroscopy

EBIC:

electron beam induced currents

EELS:

electron energy-loss spectroscopy

EPMA:

electron probe microanalysis

FID:

flame ionization detector

FID:

free-induction decay

FT:

Fourier transform

GC:

gas chromatography

IR:

infrared region

LC:

liquid chromatography

NMR:

nuclear magnetic resonance

PAC:

perturbed angular correlations

PCR:

polymerase chain reaction

PEELS:

parallel electron energy loss spectroscopy

PL:

photoluminescence

RF:

radiofrequency

SEM:

scanning electron microscope

SNOM:

scanning near-field optical microscopy

STEM:

scanning transmission electron microscope

STM:

scanning tunneling microscopes

TEM:

transmission electron microscope

TOF:

time-of-flight

XPS:

X-ray photoelectron spectroscopy

bcc:

body-centered cubic

fcc:

face-centered cubic

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Authors and Affiliations

  1. Department of Applied Physics, The University of Tokyo, Hongo, Bunkyo-ku, 113-8656, Tokyo, Japan

    Koji Maeda Prof.

  2. Institute of Materials Science, University of Tsukuba, 305-8573, Tsukuba, Ibaraki, Japan

    Hiroshi Mizubayashi Prof.

Authors
  1. Koji Maeda Prof.
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  2. Hiroshi Mizubayashi Prof.
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Corresponding authors

Correspondence to Koji Maeda Prof. or Hiroshi Mizubayashi Prof. .

Editor information

Editors and Affiliations

  1. Department of Electrical Engineering and Precision Engineering, University of Applied Sciences, TFH Berlin, Luxemburger Strasse 10, 13353, Berlin, Germany

    Horst Czichos Prof.

  2. National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan

    Tetsuya Saito

  3. National Institute of Standards and Technology (NIST), Gaithersburg, MD, US

    Leslie Smith

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Maeda, K., Mizubayashi, H. (2006). Nanoscopic Architecture and Microstructure. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Materials Measurement Methods. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30300-8_5

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