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Measurement Strategy and Quality

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Springer Handbook of Materials Measurement Methods

Part of the book series: Springer Handbooks ((SHB))

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Abstract

Technology and today's global economy depend on reliable measurements and tests that are accepted internationally. In this context, metrology, the science of measurement, is a fundamental element in the materials measurement system, as has been explained in Chap. 1. Metrology can be considered in categories with different levels of complexity and accuracy:

  • Scientific metrology deals with the organisation and development of measurement standards and with their maintenance.

  • Industrial metrology has to ensure the adequate functioning of measurement instruments used in industry as well as in production and testing processes.

  • Legal metrology is concerned with measurements that influence the transparency of economic transactions, health, and safety.

However all scientific, industrial, and legal metrological tasks need appropriate methodologies for measurement strategy and quality, which are compiled in this chapter. These are the essential tools to achieve the quality and competence required by today's market.

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Abbreviations

ANOVA:

analysis of variance

ASTM:

American Society for Testing and Materials

BAM:

Bundesanstalt für Materialforschung und -prüfung

CE:

capillary electrophoresis

CE:

counter electrode

CIPM:

International Committee for Weights and Measures

CMC:

calibration and measurement capability

CRM:

certified reference material

CTS:

collaborative trial in sampling

DC:

direct-current

FFP:

fitness for purpose

HPLC:

high-performance liquid chromatography

ILAC:

International Laboratory Accreditation Cooperation

ILC:

inter-laboratory comparisons

ISO:

International Organization for Standardization

KC:

key comparisons

MAD:

median absolute deviation

MRA:

recognition arrangement

MS:

mass spectrometer

NAB:

national accreditation bodies

NIST:

National Institute of Standards and Technology

NMI:

National Metrology Institute

PAC:

perturbed angular correlations

PT:

phototube

QA:

quality assurance

QC:

quality control

RM:

reference materials

SAQCS:

sampling and analytical quality control scheme

SPT:

sampling proficiency test

SST:

single-sheet tester

VAMAS:

Versailles project on advanced materials and standards

XRF:

X-ray-fluorescence

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Author information

Authors and Affiliations

  1. Department of Biology and Environmental Science, Centre for Environmental Research, University of Sussex, Sussex House, BN1 9RH, Brighton, UK

    Michael Ramsey Prof.

  2. Proficiency Testing and Training, LGC Ltd., Queens Road, TW11 0LY, Teddington, UK

    Nick Boley Chartered Scientist

  3. Bioinformatics and Statistics, LGC Ltd., Queens Road, Teddington, TW11 0LY, Middlesex, UK

    Stephen Ellison Dr.

  4. Analytical Chemistry; Reference Materials, Federal Institute for Materials Research and Testing (BAM), Richard-Willstätter-Str. 11, 12489, Berlin, Germany

    Werner Hässelbarth Dr.

  5. The Swiss Accreditation Service (SAS), Lindenweg 50, CH 3003, Berne, Switzerland

    Hanspeter Ischi

  6. General and Analytical Chemistry, Montanuniversität Leoben, Franz-Josef-Strasse 18, 8700, Leoben, Austria

    Wolfhard Wegscheider Prof.

  7. Rapsweg 115, 04207, Leipzig, Germany

    Adolf Zschunke

Authors
  1. Michael Ramsey Prof.
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  2. Nick Boley Chartered Scientist
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  3. Stephen Ellison Dr.
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  4. Werner Hässelbarth Dr.
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  5. Hanspeter Ischi
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  6. Wolfhard Wegscheider Prof.
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  7. Adolf Zschunke
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Corresponding authors

Correspondence to Michael Ramsey Prof. , Nick Boley Chartered Scientist , Stephen Ellison Dr. , Werner Hässelbarth Dr. , Hanspeter Ischi , Wolfhard Wegscheider Prof. or Adolf Zschunke .

Editor information

Editors and Affiliations

  1. Department of Electrical Engineering and Precision Engineering, University of Applied Sciences, TFH Berlin, Luxemburger Strasse 10, 13353, Berlin, Germany

    Horst Czichos Prof.

  2. National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan

    Tetsuya Saito

  3. National Institute of Standards and Technology (NIST), Gaithersburg, MD, US

    Leslie Smith

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© 2006 Springer-Verlag

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Ramsey, M. et al. (2006). Measurement Strategy and Quality. In: Czichos, H., Saito, T., Smith, L. (eds) Springer Handbook of Materials Measurement Methods. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-30300-8_2

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