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High-Resolution Soft X-ray Resonant Inelastic X-ray Scattering

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Synchrotron Light Sources and Free-Electron Lasers

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Abstract

With the development of higher and higher-energy resolution instruments for carrying out soft X-ray resonant inelastic scattering (RIXS) measurements, the range of problems that can be addressed has dramatically broadened. This article highlights a few examples of research done in the very recent years in order to give the reader an idea of what can be done and what problems can be addressed with this technique. The examples are by no means exhaustive, as the field is developing quickly and the examples given are taken from research on solids and in particular correlated materials. There are also applications in liquids and gases and other interesting work where the highest energy resolution is not the defining parameter, which is not addressed here.

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Acknowledgments

The help of D. Betto, L. Braicovich, A-M. Charvet, G. Ghiringhelli, K. Kummer, W. S. Lee, and F. Yakhou-Harris in preparing this chapter is greatly appreciated.

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Authors and Affiliations

  1. European Synchrotron Radiation Facility ESRF, Grenoble Cedex 9, France

    N. B. Brookes

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  1. N. B. Brookes
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Correspondence to N. B. Brookes .

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Editors and Affiliations

  1. Helmholtz-Zentrum Berlin, Berlin, Germany

    Eberhard Jaeschke

  2. Zentrum für Synchrotronstrahlung, TU Dortmund, Dortmund, Germany

    Shaukat Khan

  3. FS-CFEL-1, DESY, Hamburg, Germany

    Jochen R. Schneider

  4. SLAC National Accelerator Laboratory Linac Coherent Light Source, Stanford University, Menlo Park, CA, USA

    Jerome B. Hastings

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Brookes, N.B. (2019). High-Resolution Soft X-ray Resonant Inelastic X-ray Scattering. In: Jaeschke, E., Khan, S., Schneider, J., Hastings, J. (eds) Synchrotron Light Sources and Free-Electron Lasers. Springer, Cham. https://doi.org/10.1007/978-3-319-04507-8_75-1

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  • DOI: https://doi.org/10.1007/978-3-319-04507-8_75-1

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