Years and Authors of Summarized Original Work
2003; Chang, Sapatnekar
2005; Chang, Sapatnekar
Problem Definition
The timing behavior of integrated systems is strongly affected by the characteristics of transistors and wires in the system. Variations in the manufacturing process can cause drifts in these characteristics from one manufactured part to another. The traditional approach to addressing these variations was to choose a worst-case value for each process parameter, but this has become unsustainable in the face of current-day variations. Statistical timing analysis provides a computationally efficient way to translate the probability density function of the underlying process parameter spread to the distribution of circuit timing.
A key underlying structure for timing analysis is a graph G(V, E) of a combinational circuit, where the vertex set Vcorresponds to the gates, primary inputs, and primary outputs of the circuit, and each connection between these gates corresponds to an...
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsRecommended Reading
Chang H, Sapatnekar SS (2003) Statistical timing analysis considering spatial correlations using a single PERT-like traversal. In: Proceedings of the IEEE/ACM international conference on computer-aided design, San Jose, pp 621–625
Chang H, Sapatnekar SS (2005) Statistical timing analysis under spatial correlations. IEEE Trans Comput-Aided Des Integr Circuits Syst 24(9):1467–1482
Clark CE (1961) The greatest of a finite set of random variables. Oper Res 9:85–91
Hyvärinen A, Oja E (2000) Independent component analysis: algorithms and applications. Neural Netw 13:411–430
Jacobs E, Berkelaar MRCM (2000) Gate sizing using a statistical delay model. In: Proceedings of design and test in Europe, Paris, pp 283–290
Li X, Le J, Gopalakrishnan P, Pileggi LT (2007) Asymptotic probability extraction for nonnormal performance distributions. IEEE Trans Comput-Aided Des Integr Circuits Syst 26(1):16–37
Morrison DF (1976) Multivariate statistical methods. McGraw-Hill, New York
Singh J, Sapatnekar SS (2008) A scalable statistical static timing analyzer incorporating correlated non-Gaussian and Gaussian parameter variations. IEEE Trans Comput-Aided Des Integr Circuits Syst 27(1):160–173
Synopsys Inc (2009) PrimeTimeⓇ Advanced OCV Technology. www.synopsys.com/Tools/Implementation/SignOff/CapsuleModule/PrimeTime_AdvancedOCV_WP.pdf
Visweswariah C, Ravindran K, Kalafala K, Walker SG, Narayan S, Beece DK, Piaget J, Venkateswaran N, Hemmett JG (2006) First-order incremental block-based statistical timing analysis. IEEE Trans Comput-Aided Des Integr Circuits Syst 25(10):2170–2180
Zhan Y, Strojwas AJ, Li X, Pileggi LT, Newmark D, Sharma M (2005) Correlation-aware statistical timing analysis with non-Gaussian delay distributions. In: Proceedings of the ACM/IEEE design automation conference, San Jose, pp 77–82
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2016 Springer Science+Business Media New York
About this entry
Cite this entry
Sapatnekar, S.S. (2016). Statistical Timing Analysis. In: Kao, MY. (eds) Encyclopedia of Algorithms. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-2864-4_742
Download citation
DOI: https://doi.org/10.1007/978-1-4939-2864-4_742
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4939-2863-7
Online ISBN: 978-1-4939-2864-4
eBook Packages: Computer ScienceReference Module Computer Science and Engineering