1 Detection of Particle Induced X-Ray
1.1 Characteristics of the method
Particle Induced X-Ray Emission (PIXE) is a combined process, in which continuum and characteristic X-rays are generated through the recombination of electrons and electron vacancies produced in ion-atom collision events during slowing down of a beam of charged particles in an object. The unique correspondence between the energies of characteristic X-ray lines and the atomic numbers of the excited atoms makes PIXE a useful method in instrumental analytics. The characteristic features of PIXE as an analytical tool are as follows:
applicability to the determination of absolute concentration of elemental constituents in a wide range of atomic number,
easy sample preparation; practically non-destructive direct analysis of the surface of the original objects,
high sensitivity in trace element determination on small-volume samples,
high speed in the preparations and measurements,
possibility of obtaining analytical...
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(2003). Chemical Applications of . In: Handbook of Nuclear Chemistry. Springer, Boston, MA. https://doi.org/10.1007/0-387-30682-X_28
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