CIRP Encyclopedia of Production Engineering

2019 Edition
| Editors: Sami Chatti, Luc Laperrière, Gunther Reinhart, Tullio Tolio

Surface Texture Metrological Characteristics

  • Han HaitjemaEmail author
  • Richard Leach
Reference work entry
DOI: https://doi.org/10.1007/978-3-662-53120-4_16864

Synonym

Definition

The surface texture metrological characteristics establish a common calibration framework for surface topography measuring instruments. A metrological characteristic is defined in ISO specification standards as a “Characteristic of measuring equipment, which may influence the results of measurements.”

Theory and Application

Introduction

In general, surface topography measuring instruments measure the height z of a surface, relative to a nominally horizontal x-y plane. For instruments that scan in the horizontal plane, the x-axis is the tracing axis, and the y-axis is the stepping axis. For optical measurements where the x-y plane is projected on a camera, the pixels correspond to the (x,y) coordinates, and the z coordinates are obtained by some operation, e.g., from a stack of images while the surface is moved in the z-direction.

The metrological characteristics of surface topography measuring instruments are given...
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References

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Copyright information

© CIRP 2019

Authors and Affiliations

  1. 1.Mitutoyo RCEBestThe Netherlands
  2. 2.KU Leuven, Department of Mechanical EngineeringLeuvenBelgium
  3. 3.Department of Mechanical, Materials and Manufacturing EngineeringUniversity of NottinghamNottinghamUK

Section editors and affiliations

  • Han Haitjema
    • 1
  1. 1.Mitutoyo RCEBestThe Netherlands