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Magnetic Characterization Methods for Porous Silicon

  • Klemens RumpfEmail author
  • Petra Granitzer
Living reference work entry

Abstract

Characterization methods for magnetic materials, especially nanostructured ones such as mesoporous silicon, are reviewed. Besides magnetometers, which are one of the most important instruments to investigate magnetic properties, magnetic force microscopy and magneto-optical microscopy are briefly outlined. Magnetometers measure in an integrative way over the entire sample, whereas magnetic force microscopy and magneto-optical methods probe the magnetic properties of a local region or an individual nanostructure. With magnetometers in general, field- and temperature-dependent measurements can be performed; magneto-optical microscopy can be used to get knowledge about the domain structure, and with magnetic force microscopy, the magnetization reversal of, e.g., a nanowire, can be studied.

Keywords

Porous Silicon Magnetic Force Microscope Superconducting Quantum Interference Device Pickup Coil Porous Silicon Sample 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer International Publishing Switzerland 2014

Authors and Affiliations

  1. 1.Instítute of PhysicsKarl-Franzens-UniversityGrazAustria

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