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Microscopic X-ray Fluorescence Analysis with Synchrotron Radiation Sources

  • F. Adams
  • B. Vekemans
  • G. Silversmit
  • B. De Samber
  • L. Vincze

Abstract

This chapter deals with the analytical applications of synchrotron radiation sources for trace-level analysis of materials on microscopic and submicroscopic scales. Elemental analysis with X-ray fluorescence is described in detail. Two-dimensional (2D) and three-dimensional (3D) analyses are discussed in their quantitative aspects. Related methods of analysis based on absorption edge phenomena such as X-ray absorption spectrometry (XAS) and near-edge scanning spectrometry (XANES) yielding molecular information, computerized X-ray fluorescence microtomography (XFCT) based on the penetrative character of X-rays, and microscopic X-ray diffraction (XRD) providing structural data on the sample are also briefly discussed. The methodological treatment is illustrated with a number of applications.

Keywords

Synchrotron Radiation Synchrotron Radiation Source European Synchrotron Radiation Facility Mass Absorption Coefficient Fluorescence Radiation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Abbreviations

AES

Auger emission spectrometry

CRM

Certified reference material

DL

Detection limit

ED

Energy dispersive

ESRF

European Synchrotron Radiation Facility

EXAFS

Extended X-ray absorption fine structure

NEXAFS

Near edge X-ray absorption fine structure

PCI

Phase contrast imaging

RM

Reference material

SR

Synchrotron radiation

SRM

Standard reference material

TXRF

Total reflection X-ray fluorescence

XANES

X-ray absorption near edge structure

XAS

X-ray absorption spectrometry

XDM

X-ray diffraction microscopy

XFCT

X-ray fluorescence computerized microtomography

XPEEM

X-ray photoelectron microscopy

XPS

X-ray photoelectron spectrometry

XRD

X-ray diffraction

XRF

X-ray fluorescence

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Copyright information

© Springer Science+Business Media B.V. 2011

Authors and Affiliations

  • F. Adams
    • 1
  • B. Vekemans
    • 2
  • G. Silversmit
    • 2
  • B. De Samber
    • 2
  • L. Vincze
    • 2
  1. 1.Campus Drie EikenUniversity of AntwerpAntwerpBelgium
  2. 2.Department of Analytical ChemistryGhent UniversityGentBelgium

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