Skip to main content

Test Sample and Size

  • Reference work entry
Encyclopedia of Biometrics
  • 78 Accesses

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 449.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Hahn, G.J., Meeker, W.Q.: Statistical Intervals: A Guide for Practioners. Wiley, New York (1991)

    Google Scholar 

  2. Deming, W.E.: On probability as a basis for action. Am. Statist. 29(4),146–152 (1975)

    Article  Google Scholar 

  3. Wayman, J.L.: Confidence interval and test size estimation for biometric data. In: National Biometrics Test Center, Collected Works 1997–2000. http://www.engr.sjsu.edu/biometrics/nbtccw.pdf, pp. 89–99 (2000)

  4. Wayman, J.L.: Confidence interval and test size estimation for biometric data. In: Proceedings of IEEE AutoID ’99, pp. 177–184 (1999)

    Google Scholar 

  5. Mansfield, T., Wayman, J.L.: Best practices in testing and reporting performance of biometric devices on the web at http://www.cesg.gov.uk/site/ast/biometrics/media/BestPractice.pdf (2002)

  6. Louis, T.A.: Confidence intervals for a binomial parameter after observing no successes. Am. Statist. 35(3), 154 (1981)

    Article  MathSciNet  Google Scholar 

  7. Jovanovic, B.D., Levy, P.S.: A look at the rule of three. Am. Statist. 51(2), 137–139 (1997)

    Article  Google Scholar 

  8. Doddington, G.R., Przybocki, M.A., Martin, A.F., Reynolds, D.A.: The NIST speaker recognition evaluation: overview methodology, systems, results, perspective. Speech Commun. 31(2–3), 225–254 (2000)

    Article  Google Scholar 

  9. Schuckers, M.E., Sheldon, E., Hartson, H.: When enough is enough: early stopping of biometrics error rate testing. In: Proceedings of the IEEE Workshop on Automatic Identification Advanced Technologies (AutoID) (2007)

    Google Scholar 

  10. Schuckers, M.E.: Estimation and sample size calculations for correlated binary error rates of biometric identification rates. In: Proceedings of the American Statistical Association: Biometrics Section [CD-ROM], Alexandria, VA, American Statistical Association (2003)

    Google Scholar 

  11. Fleiss, J.L., Levin, B., Paik, M.C.: Statistical Methods for Rates and Proportions. Wiley, New York (2003)

    Book  MATH  Google Scholar 

  12. Serfling, R.J.: Contributions to central limit theory for dependent variables. Ann. Math. Stat. 39(4), 1158–1175 (1968)

    Article  MATH  MathSciNet  Google Scholar 

  13. Lohr, S.L.: Sampling: Design and Analysis. Duxbury Press (1999)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2009 Springer Science+Business Media, LLC

About this entry

Cite this entry

Schuckers, M.E. (2009). Test Sample and Size. In: Li, S.Z., Jain, A. (eds) Encyclopedia of Biometrics. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-73003-5_113

Download citation

Publish with us

Policies and ethics