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Recognizing and Avoiding Artifacts in AFM Imaging

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Part of the Methods in Molecular Biology™ book series (MIMB,volume 242)

Abstract

Images taken with the atomic force microscope (AFM) originate in physical interactions that are totally different from those used for image formation in conventional light and electron microscopy. One of the effects is that a new series of artifacts can appear in images that may not be readily recognized by users accustomed to conventional microscopy. Because we are addressing our-selves to novices in this field, we would like to give an idea of what can happen while taking images with the AFM, how one can recognize the source of the artifact, and then try to avoid it or minimize it. Essentially, one can identify the following sources of artifacts in AFM images: the tip, the scanner, vibrations, the feedback circuit, and image-processing software.

Keywords

  • Powerful Image Processing Tools
  • Acoustic Hood
  • Floor Vibration
  • Image Correction Algorithm
  • Filtered Power Spectrum

These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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© 2004 Humana Press Inc., Totowa, NJ

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Ricci, D., Braga, P.C. (2004). Recognizing and Avoiding Artifacts in AFM Imaging. In: Braga, P.C., Ricci, D. (eds) Atomic Force Microscopy. Methods in Molecular Biology™, vol 242. Humana Press. https://doi.org/10.1385/1-59259-647-9:25

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  • DOI: https://doi.org/10.1385/1-59259-647-9:25

  • Publisher Name: Humana Press

  • Print ISBN: 978-1-58829-094-6

  • Online ISBN: 978-1-59259-647-8

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